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Volumn , Issue , 2004, Pages 69-72

A new on-wafer de-embedding technique for on-chip RF transmission line interconnect characterization

Author keywords

De embedding; On wafer measurement; S parameters; Transmission line interconnect

Indexed keywords

CHARACTERIZATION; CHIP SCALE PACKAGES; COMPUTER SIMULATION; COUPLED CIRCUITS; ELECTRIC LINES; EMBEDDED SYSTEMS; SCATTERING PARAMETERS;

EID: 13844249409     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (25)

References (6)
  • 2
    • 0026679924 scopus 로고    scopus 로고
    • An improved de-embedding technique for on-wafer high frequency characterization
    • M. C. A. M.. Koolen, J. A. M. Geelen, M. P. J. G. Versleijen, "An improved de-embedding technique for on-wafer high frequency characterization", 1991 BCTM Symposium, pp. 188-191.
    • 1991 BCTM Symposium , pp. 188-191
    • Koolen, M.C.A.M.1    Geelen, J.A.M.2    Versleijen, M.P.J.G.3
  • 3
    • 0038575149 scopus 로고    scopus 로고
    • A calibrated lumped-element de-embedding technique for on-wafer RF characterization of high-quality inductors and high-speed transistors
    • March
    • L. F. Tiemeijer, R. J. Havens, "A calibrated lumped-element de-embedding technique for on-wafer RF characterization of high-quality inductors and high-speed transistors," IEEE Transactions on Electron Devices, Vol. 50, No. 3, March 2003, pp. 823-829.
    • (2003) IEEE Transactions on Electron Devices , vol.50 , Issue.3 , pp. 823-829
    • Tiemeijer, L.F.1    Havens, R.J.2
  • 4
    • 18844444957 scopus 로고    scopus 로고
    • http://www.zeland.com


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.