Extraction of frequency dependent transmission line parameters using TDR/TDT measurements

Conference Record - IEEE Instrumentation and Measurement Technology Conference

Volumn 3, Issue , 2001, Pages 1726-1730

  Swaminathan, Madhavan ^a   Pannala, Sreemala ^b   Roy, Tanmoy ^b  

^a GEORGIA INSTITUTE OF TECHNOLOGY   (United States)

^b SUN MICROSYSTEMS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BANDWIDTH; COMPUTER SIMULATION; ELECTRIC IMPEDANCE; ELECTROMAGNETIC WAVE PROPAGATION; FEATURE EXTRACTION; FREQUENCIES; FREQUENCY RESPONSE; PARAMETER ESTIMATION; PRINTED CIRCUIT BOARDS; TIME DOMAIN ANALYSIS; TRANSFER FUNCTIONS;

DEVICE UNDER TEST; GENERALIZED PENCIL OF FUNCTION METHOD; SOFTWARE PACKAGE SPICE; STRIPLINE STRUCTURE; TIME DOMAIN REFLECTOMETRY MEASUREMENT; TIME DOMAIN TRANSMISSION MEASUREMENT; TIME WINDOWING;

TRANSMISSION LINE THEORY;

EID: 0034822891     PISSN: 10915281     EISSN: None     Source Type: Journal    
DOI: 10.1109/IMTC.2001.929496     Document Type: Article

References (3)

1. Accurate transmission line characterization
2. Extraction of S-parameters from TDR/TDT measurements using rational functions
3. Extraction of the frequency dependent characteristic impedance of transmission lines using TDR measurements