Compensation for geometrical variations in coplanar waveguide probe-tip calibration

IEEE Microwave and Guided Wave Letters

Volumn 7, Issue 4, 1997, Pages 97-99

  Walker, David K ^a   Williams, Dylan F ^a,b  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b IEEE

Author keywords

Automatic network analyzers; Coplanar waveguide; On wafer calibration

Indexed keywords

CALIBRATION; CAPACITANCE; ELECTRIC NETWORK ANALYZERS; PARAMETER ESTIMATION;

COPLANAR WAVEGUIDE CONDUCTOR GEOMETRY; COPLANAR WAVEGUIDE PROBE TIP SCATTERING PARAMETER CALIBRATIONS; MULTILINE THRU REFLECT LINE CALIBRATIONS; ON WAFER CALIBRATION;

WAVEGUIDES;

EID: 0031122149     PISSN: 10518207     EISSN: None     Source Type: Journal    
DOI: 10.1109/75.563631     Document Type: Article

References (6)

1. D. F. Williams and R. B. Marks, "Compensation for substrate permittivity in probe-tip calibration," in Dig. 44th ARFTG Conf., Dec. 1994, pp. 20-30.
2. R. B. Marks, "A multiline method of network analyzer calibration," IEEE Trans. Microwave Theory Tech., vol. 39, pp. 1205-1215, July 1991.
3. D. F. Williams and R. B. Marks, "LRM probe-tip calibrations using nonideal standards," IEEE Trans. Microwave Theory Tech., vol. 43, pp. 466-469, Feb. 1995.
4. R. B. Marks and D. F. Williams, "Characteristic impedance determination using propagation constant measurement," IEEE Microwave Guided Wave Lett., vol. 1, pp. 141-143, June 1991.
5. W. Heinrich, "Quasi-TEM description of MMIC coplanar lines including conductor-loss effects," IEEE Trans. Microwave Theory Tech., vol. 41, pp. 45-52, Jan. 1993.
6. D. F. Williams, R. B. Marks, and A. Davidson, "Comparison of on-wafer calibrations," in Dig. 38th ARFTG Conf. Dec. 1991, pp. 68-81.