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Volumn 2006, Issue , 2006, Pages 1274-1280

High resolution time domain and frequency domain package characterization up to 65 GHz

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC FAULT CURRENTS; FREQUENCY DOMAIN ANALYSIS; TIME DOMAIN ANALYSIS;

EID: 33845590392     PISSN: 05695503     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ECTC.2006.1645817     Document Type: Conference Paper
Times cited : (7)

References (10)
  • 1
    • 0028494638 scopus 로고
    • Characterization and modeling of multiple line interconnections from TDR measurements
    • Hayden, L. A. and Tripathi V. K., "Characterization and modeling of multiple line interconnections from TDR measurements," IEEE Transactions on Microwave Theory and Techniques, Vol. 42, No. 9 (1994), pp. 1737-1743.
    • (1994) IEEE Transactions on Microwave Theory and Techniques , vol.42 , Issue.9 , pp. 1737-1743
    • Hayden, L.A.1    Tripathi, V.K.2
  • 6
    • 0018720739 scopus 로고
    • Thru-reflect-line": An improved technique for calibrating the dual six-port automatic network analyzer
    • Engen, G. F. and Hoer C. A., ""Thru-Reflect-Line": An Improved Technique for Calibrating the Dual Six-Port Automatic Network Analyzer," IEEE Transactions on Microwave Theory and Techniques, Vol. 27, No. 12 (1979), pp. 987-993.
    • (1979) IEEE Transactions on Microwave Theory and Techniques , vol.27 , Issue.12 , pp. 987-993
    • Engen, G.F.1    Hoer, C.A.2
  • 7
    • 0024629067 scopus 로고
    • A simple broad-band device de-embedding method using an automatic network analyzer with time-domain option
    • Gronau, G. and Wolff I., "A Simple Broad-Band Device De-Embedding Method Using an Automatic Network Analyzer with Time-Domain Option," IEEE Transactions on Microwave Theory and Techniques, Vol. 37, No. 3 (1989), pp. 479-483.
    • (1989) IEEE Transactions on Microwave Theory and Techniques , vol.37 , Issue.3 , pp. 479-483
    • Gronau, G.1    Wolff, I.2
  • 10
    • 0034205959 scopus 로고    scopus 로고
    • Port reduction methods for scattering matrix measurement of an n-port network
    • Lu H.-C. and Chu T.-H., "Port Reduction Methods for Scattering Matrix Measurement of an n-Port Network," IEEE Transactions on Microwave Theory and Techniques, Vol. 48, No. 6 (2000), pp. 959-968.
    • (2000) IEEE Transactions on Microwave Theory and Techniques , vol.48 , Issue.6 , pp. 959-968
    • Lu, H.-C.1    Chu, T.-H.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.