Accurate determination of the characteristic impedance of lossy lines on chips based on high frequency S-parameter measurements

Proceedings of the IEEE Multi-Chip Module Conference

Volumn , Issue , 1996, Pages 190-195

  Winkel, Thomas Michael ^a   Dutta, Lohit Sagar ^a   Grabinski, Hartmut ^a  

^a LEIBNIZ UNIVERSITY HANNOVER   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CONDUCTIVITY; ELECTRIC CONTACTS; ELECTRIC IMPEDANCE; ELECTRIC LINES; ELECTROMAGNETIC WAVE PROPAGATION; INTEGRATED CIRCUITS; MICROPROCESSOR CHIPS; NUMERICAL METHODS; PROBES; SEMICONDUCTOR MATERIALS; SILICON WAFERS; SUBSTRATES;

HIGH FREQUENCY S PARAMETER MEASUREMENTS; INTERCONNECTS; LOSSY LINES; PROPAGATION CONSTANT;

ELECTRIC IMPEDANCE MEASUREMENT;

EID: 0029771322     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (9)