The effect of traps on the performance of graphene field-effect transistors

Applied Physics Letters

Volumn 96, Issue 19, 2010, Pages

  Zhu, J ^a   Jhaveri, R ^a   Woo, J C S ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

GATE VOLTAGES; MOBILE CHARGE; ON/OFF RATIO; PERFORMANCE DEGRADATION; TRAPPED CHARGE;

GRAPHENE; GRAPHITE;

FIELD EFFECT TRANSISTORS;

EID: 77953011724     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3428785     Document Type: Article

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