Spatial correlation between optical properties and defect formation in GaN thin films laterally overgrown on cone-shaped patterned sapphire substrates

Journal of Applied Physics

Volumn 107, Issue 10, 2010, Pages

  Lee, Kyu Seung ^a   Kwack, Ho Sang ^a   Hwang, Jun Seok ^a   Roh, Tae Moo ^a   Cho, Yong Hoon ^a   Lee, Jae Hoon ^b   Kim, Yong Chun ^b   Kim, Chang Soo ^c  

^a Korea Advanced Institute of Science and Technology (KAIST)   (South Korea)

^b Samsung Advanced Institute of Technology (SAIT)   (South Korea)

^c Korea Research Institute of Standards and Science   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL QUALITIES; DARK SPOTS; DEFECT FORMATION; EXCITONIC EMISSION; GAN THIN FILMS; GROWTH MODES; LATERAL OVERGROWTH; LOCAL STRUCTURAL PROPERTIES; METALORGANIC CHEMICAL VAPOR DEPOSITION; PATTERNED SAPPHIRE; PATTERNED SAPPHIRE SUBSTRATE; RED-SHIFTED; SAPPHIRE SUBSTRATES; SHAPED PATTERN; SPATIAL CORRELATIONS;

DEFECTS; DEPOSITION; GALLIUM NITRIDE; METALLORGANIC CHEMICAL VAPOR DEPOSITION; OPTICAL CORRELATION; OPTICAL PROPERTIES; ORGANIC CHEMICALS; SAPPHIRE; THIN FILMS;

GALLIUM ALLOYS;

EID: 77952996231     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3388014     Document Type: Article

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