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Volumn 3, Issue , 2006, Pages 2169-2173
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Improvement of luminous intensity of InGaN light emitting diodes grown on hemispherical patterned sapphire
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Author keywords
[No Author keywords available]
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Indexed keywords
CORRUGATED INTERFACES;
DISLOCATION DENSITY;
HEMISPHERICAL PATTERNED SAPPHIRE (HPS);
LUMINOUS INTENSITY;
68.37.PS;
78.60.FI;
81.15.GH;
85.60.JB;
EXTERNAL QUANTUM EFFICIENCY;
EXTRACTION EFFICIENCIES;
TOTAL INTERNAL REFLECTIONS;
DISLOCATIONS (CRYSTALS);
INTERFACES (MATERIALS);
LIGHT REFLECTION;
QUANTUM EFFICIENCY;
SAPPHIRE;
SEMICONDUCTING INDIUM COMPOUNDS;
SEMICONDUCTOR GROWTH;
FILM GROWTH;
LUMINANCE;
REFRACTIVE INDEX;
LIGHT EMITTING DIODES;
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EID: 33746324812
PISSN: 18626351
EISSN: None
Source Type: Journal
DOI: 10.1002/pssc.200565308 Document Type: Conference Paper |
Times cited : (54)
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References (8)
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