Atomic force microscopy characterization of cellulose nanocrystals

Langmuir

Volumn 26, Issue 6, 2010, Pages 4480-4488

  Lahiji, Roya R ^a,b   Xu, Xin ^a,c   Reifenberger, Ronald ^a,b   Raman, Arvind ^a,c   Rudie, Alan ^d   Moon, Robert J ^a,d  

^a PURDUE UNIVERSITY   (United States)

^b Department of Physics ^*  (United States)

^c Purdue University   (United States)

^d FOREST PRODUCTS LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

3D FINITE ELEMENT; ADHESIVE PROPERTIES; AFM; AFM TIP; AMBIENT CONDITIONS; CELLULOSE NANOCRYSTALS; CRYSTALLOGRAPHIC ORIENTATIONS; DYNAMIC MODE IMAGING; FORCE-DISTANCE CURVES; HIGH RESOLUTION; MATERIAL PROPERTY CHARACTERIZATION; MINIMAL EFFECTS; NANO MANIPULATOR; NANOCOMPOSITE MATERIALS; NANOMATERIAL; RELATIVE HUMIDITIES; TRANSVERSE ELASTIC MODULI; WATER PENETRATION;

ATMOSPHERIC HUMIDITY; CELLULOSE; CELLULOSE DERIVATIVES; CHEMICAL PROPERTIES; MECHANICAL PROPERTIES; NANOCOMPOSITES; NANOCRYSTALS; SINGLE CRYSTALS;

ATOMIC FORCE MICROSCOPY;

CELLULOSE DERIVATIVES; CHEMICAL PROPERTIES; COMPOSITES; HUMIDITY; MECHANICAL PROPERTIES; MICROSCOPES; RESOLUTION; SINGLE CRYSTALS; WOOD;

CELLULOSE; NANOPARTICLE;

ARTICLE; ATOMIC FORCE MICROSCOPY; CHEMISTRY; FINITE ELEMENT ANALYSIS; METHODOLOGY;

CELLULOSE; FINITE ELEMENT ANALYSIS; MICROSCOPY, ATOMIC FORCE; NANOPARTICLES;

EID: 77952994514     PISSN: 07437463     EISSN: 15205827     Source Type: Journal    
DOI: 10.1021/la903111j     Document Type: Article

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