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Journal of Adhesion

Volumn 74, Issue 1-4, 2000, Pages 341-359

Atomic force microscope techniques for adhesion measurements

(2) Schaefer, D M a Gomez, J b

a TOWSON UNIVERSITY (United States)

b UNIVERSIDAD AUTÓNOMA DE MADRID (Spain)

Author keywords

Adhesion maps; Atomic force microscopy; Force curves; Jump mode

Indexed keywords

ATOMIC FORCE MICROSCOPY; CANTILEVER BEAMS; SUBSTRATES; VAN DER WAALS FORCES;

ADHESION MAPS;

ADHESION;

EID: 0034439949 PISSN: 00218464 EISSN: None Source Type: Journal
DOI: 10.1080/00218460008034535 Document Type: Article

Times cited : (16)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.