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Journal of Applied Physics

Volumn 107, Issue 10, 2010, Pages

Direct observations of Ge2 Sb2Te5 recording marks in the phase-change disk

(5) Naito, Muneyuki a,c Ishimaru, Manabu a Hirotsu, Yoshihiko a Kojima, Rie b Yamada, Noboru b

a OSAKA UNIVERSITY (Japan)

b PANASONIC CORPORATION (Japan)

c KONAN UNIVERSITY (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC PAIR DISTRIBUTION FUNCTIONS; ATOMISTIC STRUCTURE; CHEMICAL ORDER; CROSS-SECTIONAL TEM; DIRECT OBSERVATION; INTENSITY PROFILES; LASER IRRADIATIONS; NANOBEAM ELECTRON DIFFRACTION; PHASE-CHANGE DISKS; RECORDING MARKS; TEM;

DISKS (STRUCTURAL COMPONENTS); GERMANIUM; HOLOGRAPHIC INTERFEROMETRY; IRRADIATION; METALLIC GLASS; SCANNING ELECTRON MICROSCOPY; TELLURIUM COMPOUNDS; TRANSMISSION ELECTRON MICROSCOPY;

DISTRIBUTION FUNCTIONS;

EID: 77952991393 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.3373419 Document Type: Article

Times cited : (15)

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