Structure and electrical properties of Mg-doped ZnO nanoparticles

Crystal Research and Technology

Volumn 45, Issue 5, 2010, Pages 529-538

  Kilinc N ^a   Arda, L ^b   Ozturk S ^a   Ozturk Z Z ^a,c  

^a GEBZE TECHNICAL UNIVERSITY   (Turkey)

^b BAHCESEHIR UNIVERSITY   (Turkey)

^c MATERIALS INSTITUTE   (Turkey)

Author keywords

CBH; Conductivity; Impedance spectroscopy; Mg doped ZnO; Microstructure; Nanoparticle

Indexed keywords

AC CONDUCTIVITY; AVERAGE PARTICLE SIZE; CAPACITIVE ELEMENTS; COMPLEX IMPEDANCE; CONDUCTION MECHANISM; CONDUCTIVITY; CORRELATED BARRIER HOPPING; DATA POINTS; DC CONDUCTIVITY; DOPED ZNO; ELECTRICAL MEASUREMENT; ELECTRICAL PROPERTY; FREQUENCY RANGES; GAS FLOWS; IMPEDANCE SPECTROSCOPY; MG-DOPED; NYQUIST PLOTS; POWER LAW; ROOM TEMPERATURE; SOL-GEL TECHNIQUE; TEMPERATURE RANGE; ZNO; CBH; COMPLEX IMPEDANCE PLOTS; MG-DOPED ZNO; WIDE TEMPERATURE RANGES;

ACTIVATION ENERGY; DOPING (ADDITIVES); ELECTRIC PROPERTIES; GELS; MICROSTRUCTURE; SYNTHESIS (CHEMICAL); X RAY DIFFRACTION; ZINC; ZINC OXIDE; ELECTRIC CONDUCTIVITY; FLOW RATE; NANOPARTICLES; SOL-GELS;

NANOPARTICLES; ELECTRIC PROPERTIES;

EID: 77952973714     PISSN: 02321300     EISSN: 15214079     Source Type: Journal    
DOI: 10.1002/crat.200900662     Document Type: Article

References (37)

1. B. B. Rao, Mater Chem. Phys. 64, 62 (2000).
2. R. W. Birkmire and E. Eser, Annu. Rev. Mater Sci. 27, 625 (1997).
3. T. Aoki, Y. Hatanaka, and D. C. Look, Appl. Phys. Lett. 76, 3257 (2000).
4. S. J. Pearton, D. P. Norton, K. Ip, Y. W. Heo, and T. Steiner, Prog. Mater. Sci. 50, 293 (2005).
5. G. H. Ning, X. P. Zhao, and J. Li, Opt. Mater. 27, 1 (2004).
6. Z. Q. Ma, W. G. Zhao, and Y. Wang, Thin Solid Films 515, 8611 (2007).
7. L. Zhuang and K. H. Wong, Thin Solid Films 516, 5607 (2008).
8. E. Barsoukov and J. R. Macdonald, Impedance Spectroscopy: Theory, Experiment, and Applications, Second Edition (Wiley InterScience, New Jersey, 2005).
9. Z. K. Haiba and L. Arda, Cryst. Res. Technol. 44, 845 (2009).
10. P. Bhattacharya, R. R. Das, and Ram S. Katiyar, Thin Solid Films 447-448, 564 (2004).
11. S. J. Pearton, D. P. Norton, K. Ip, Y. W. Heo, and T. Steiner, Prog. Mater. Sci. 50, 293 (2005).
12. S. J. Pearton, D. P. Norton, K. Ip, Y. W. Heo, and T. Steiner, J. Vacuum Sci. Technol. B 22, 932 (2004).
13. T. Ghosh, M. Dutta, S. Mridha, and D. Basak, J. Electrochem. Soc. 156, H285 (2009).
14. J. P. Han, P. Q. Mantas, and A. M. R. Senos, J. Eur. Ceram. Soc. 22, 49 (2002).
15. J. P. Han, P. Q. Mantas, and A. M. R. Senos, J. Eur. Ceram. Soc. 21, 1183 (2001).
16. W. Chen, J. Wang, and M. R Wang, Vacuum 81, 894 (2007).
17. Y. S. Wang, P. J. Thomas, and P. O'Brien, J. Phys. Chem. B 110, 21412 (2006).
18. J. Y. Cho, I. K. Kim, I. O. Jung, J. H. Moon, and J. H. Kim, J. Electroceram. DOI: 10.1007/s10832-008-9485-3.
19. S. R. Elliot, Adv. Phys. 2, 135 (1987).
20. S. R. Elliot, Phil. Mag. B 37, 553 (1978).
21. N. F. Mott and E.A. Davis, Electronic Processes in Non-crystalline Materials, 2nd ed. (Oxford University Press, London, 1979).
22. A. R. Long, Adv. Phys. 31, 553 (1982).
23. J. P. Han, M. R. Shen, W. W. Cao, A. M. R. Senos, and P. Q. Mantas, Appl. Phys. Lett. 82, 67 (2003).
24. Dhananjay, J. Nagaraju, and S. B. Krupanidhi, Mat. Sci. Eng. B 133, 70 (2006).
25. P. P. Sahay, S. Tewari, R. K. Nath, S. Jha, and M. Shamsuddin, J. Mat. Sci. 43, 4534 (2008).
26. R. Ondo-Ndong, G. Ferblantier, F. Pascal-Delannoy, A. Boyer, and A. Foucaran, Microelectro. J. 34, 1087 (2003).
27. V. Gupta and A. Mansingh, Phys. Rev. B 49, 1989 (1994).
28. R. Kumar and N. Khare, Thin Solid Films 516, 1302 (2008).
29. Y. J. Ma, Z. Zhang, F. Zhou, L. Lu, A. Z. Jin, and C. Z. Gu, Nanotechnol. 16, 746 (2005).
30. S. Bandyopadhyay, G. K. Paul, R. Roy, S. K. Sen, and S. Sen, Mat. Chem. Phys. 74, 83 (2002).
31. S. P. Heluani, G. Braunstein, M. Villafuerte, G. Simonelli, and S. Duhalde, Thin Solid Films 515, 2379 (2006).
32. Y. Natsume and H. Sakata, Mat. Chem. Phys. 78, 170 (2002).
33. Y. Natsume, H. Sakata, and T. Hirayama, Phys. Status Solidi A 148, 485 (1995).
34. Y. Natsume, H. Sakata, and T. Hirayama, J. Appl. Phys. 72, 4203 (1992).
35. Dhananjay, J. Nagaraju, and S. B. Krupanidhi, Mater. Sci. Eng. B 137, 126 (2007).
36. Z. Zhou, K. Kato, T. Komaki, M. Yoshino, H. Yukawa, M. Morinaga, and K. Morita, J. Eur. Ceram. Soc. 24, 139 (2004).
37. Dhananjay, J. Nagaraju, and S. B. Krupanidhi, J. Appl. Phys. 101, 104104 (2007).