Investigations on zinc oxide thin films grown on Si (1 0 0) by thermal oxidation

Materials Science and Engineering: B

Volumn 137, Issue 1-3, 2007, Pages 126-130

  Dhananjay, ^a   Nagaraju, J ^a   Krupanidhi, S B ^a  

^a INDIAN INSTITUTE OF SCIENCE   (India)

Author keywords

Complex impedance spectroscopy; Heterojunction; Thermal oxidation

Indexed keywords

FILM GROWTH; HETEROJUNCTIONS; OXIDATION; SCANNING ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS; ZINC OXIDE;

CAPACITANCE-VOLTAGE (C-V) MEASUREMENTS; COMPLEX IMPEDANCE SPECTROSCOPY; THERMAL OXIDATION;

THIN FILMS;

EID: 33846808937     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mseb.2006.11.007     Document Type: Article

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