Some factors affecting EBSD pattern quality of Ga+ ion-milled face centred cubic metal surfaces

Materials Chemistry and Physics

Volumn 106, Issue 1, 2007, Pages 142-148

  Mateescu, N ^a   Ferry, M ^a   Xu, W ^a   Cairney, J M ^b  

^a UNIVERSITY OF NEW SOUTH WALES   (Australia)

^b UNIVERSITY OF SYDNEY   (Australia)

Author keywords

Defects; Electron diffraction; Metals; Recrystallization

Indexed keywords

BACKSCATTERING; CRYSTAL STRUCTURE; ELECTRON DIFFRACTION; FOCUSED ION BEAMS; MICROSTRUCTURE; SINGLE CRYSTALS;

ATOMIC NUMBER; ELECTRON BACKSCATTER DIFFRACTION; FACE CENTRED CUBIC METAL SURFACES; MILLING CURRENT; RECRYSTALLIZATION;

GALLIUM;

EID: 34548863103     PISSN: 02540584     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matchemphys.2007.05.048     Document Type: Article

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