In situ SEM indentation experiments: Instruments, methodology, and applications

Microscopy Research and Technique

Volumn 72, Issue 3, 2009, Pages 242-249

  Ghisleni, Rudy ^a   Rzepiejewska Malyska, Karolina ^a   Philippe, Laetitia ^a   Schwaller, Patrick ^a   Michler, Johann ^a  

^a SWISS FEDERAL LABORATORIES FOR MATERIALS SCIENCE AND TECHNOLOGY   (Switzerland)

Author keywords

Electrodeposited cobalt; Nanoindentation; Nanowire; Thin film

Indexed keywords

COBALT; ELECTRODES; NANOWIRES; SCANNING ELECTRON MICROSCOPY;

CANDIDATE MATERIALS; ELECTRODEPOSITED COBALT; INDENTATION EXPERIMENT; LOAD RANGE; NANO INDENTATION; NEMS DEVICES; SCANNING ELECTRONS; SITU SCANNING; THIN-FILMS;

THIN FILMS;

COBALT; FERROMAGNETIC MATERIAL; NANOWIRE;

ARTICLE; CONTROLLED STUDY; DEVICE; FILM; MAGNETIC AND ELECTROMAGNETIC EQUIPMENT; MATERIALS HANDLING; MICROINDENTER; NANOINDENTATION; NANOINDENTER; NANOTECHNOLOGY; PICOINDENTER; PRIORITY JOURNAL; SCANNING ELECTRON MICROSCOPY; SURFACE PROPERTY;

EID: 61449265093     PISSN: 1059910X     EISSN: 10970029     Source Type: Journal    
DOI: 10.1002/jemt.20677     Document Type: Article

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