Micro-compression testing: A critical discussion of experimental constraints

Materials Science and Engineering: A

Volumn 505, Issue 1-2, 2009, Pages 79-87

  Kiener, D ^a,b   Motz, C ^b   Dehm, G ^b,c  

^a MATERIALS CENTER LEOBEN FORSCHUNG GMBH   (Austria)

^b Erich Schmid Institute of Materials Science   (Austria)

^c UNIVERSITY OF LEOBEN   (Austria)

Author keywords

Compression test; Copper; Focused ion beam (FIB); Mechanical properties; Plastic deformation

Indexed keywords

COMPRESSION TESTING; COPPER; DISLOCATIONS (CRYSTALS); DISPLACEMENT CONTROL; FOCUSED ION BEAMS; INTERFACES (MATERIALS); PILES; SCANNING ELECTRON MICROSCOPY; SINGLE CRYSTALS; STIFFNESS;

COMPRESSION TEST; CRITICAL DISCUSSIONS; FOCUSED ION BEAM; FOCUSED IONS BEAMS; LENGTH SCALE; MICRO COMPRESSION TESTING; MICRO-MECHANICAL; NANO INDENTATION; PILE-UPS; SYSTEM STIFFNESS;

CRYSTAL ORIENTATION;

EID: 59649086366     PISSN: 09215093     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.msea.2009.01.005     Document Type: Article

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