Transmission electron microscopy study on the crystallization of Sb-Se-Te ternary alloys

Japanese Journal of Applied Physics

Volumn 48, Issue 10 Part 1, 2009, Pages 1055011-1055013

  Yoon, Jong Moon ^a   Kim, Eun Tae ^a   Lee, Jeong Yong ^a   Kim, Yong Tae ^b  

^a Korea Advanced Institute of Science and Technology (KAIST)   (South Korea)

^b Korea Institute of Science and Technology   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

REDUCING POWER;

CERIUM ALLOYS; GERMANIUM; PHASE CHANGE MATERIALS; RAPID THERMAL ANNEALING; RAPID THERMAL PROCESSING; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTING SELENIUM COMPOUNDS; TELLURIUM COMPOUNDS; TERNARY ALLOYS; TERNARY SYSTEMS; THIN FILMS; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS;

HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY;

EID: 77952692839     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJAP.48.105501     Document Type: Article

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