In situ transmission electron microscopy study of the crystallization of Ge2Sb2Te5

Journal of Applied Physics

Volumn 95, Issue 3, 2004, Pages 924-932

  Kooi, B J ^a   Groot, W M G ^a   De Hosson, J Th M ^a  

^a UNIVERSITY OF GRONINGEN   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS FILMS; CRYSTAL STRUCTURE; CRYSTALLIZATION; CURRENT DENSITY; ELECTRON BEAMS; ELECTRON IRRADIATION; ENERGY DISPERSIVE SPECTROSCOPY; GRAIN GROWTH; OXIDATION; SCANNING ELECTRON MICROSCOPY; TEMPERATURE; TRANSMISSION ELECTRON MICROSCOPY;

EDWARDS RESISTANCE HEATING EVAPORATOR; ELECTRON BEAM EVAPORATION; LASER IRRADIATION; SELECTED AREA ELECTRON DIFFRACTION PATTERN; VARIAN ELECTRON BEAM EVAPORATOR;

GERMANIUM ALLOYS;

EID: 1142280320     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1636259     Document Type: Article

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