Properties of morphotropic phase boundary Pb(Mg1/3Nb 2/3)O3-PbTiO3 films with submicrometre range thickness on Si-based substrates

Journal of Physics D: Applied Physics

Volumn 43, Issue 20, 2010, Pages

  Alguero M ^a   Stewart, M ^b   Cain, M G ^b   Ramos, P ^c   Ricote, J ^a   Calzada, M L ^a  

^a INSTITUTO DE CIENCIA DE MATERIALES DE MADRID   (Spain)

^b NATIONAL PHYSICAL LABORATORY   (United Kingdom)

^c UNIVERSITY OF ALCALÁ   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL SOLUTION DEPOSITION; COLUMNAR MICROSTRUCTURES; DOMAIN CONFIGURATIONS; ELECTRICAL PROPERTY; FERROELECTRIC TRANSITION; FINE GRAINED; GRAIN SIZE; GRAIN SIZE EFFECT; INTERMEDIATE STATE; INTERNAL ELECTRIC FIELDS; LENGTH SCALE; MORPHOTROPIC PHASE BOUNDARIES; NANO SCALE; PHASE INSTABILITY; POLARIZATION RELAXATION; PYROELECTRIC RESPONSE; RELAXOR CHARACTERISTICS; RELAXORS; SATURATION POLARIZATION; SI-BASED; SUBSTRATE EFFECTS;

CRYSTALLOGRAPHY; ELECTRIC FIELDS; FERROELECTRIC FILMS; FERROELECTRICITY; GRAIN SIZE AND SHAPE; LEAD; POLARIZATION; SUBSTRATES;

ELECTRIC PROPERTIES;

EID: 77952407055     PISSN: 00223727     EISSN: 13616463     Source Type: Journal    
DOI: 10.1088/0022-3727/43/20/205401     Document Type: Article

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