The effect of dynamical scattering in off-axis holographic mean inner potential and inelastic mean free path measurements

Ultramicroscopy

Volumn 110, Issue 5, 2010, Pages 438-446

  Lubk, Axel ^a   Wolf, Daniel ^a   Lichte, Hannes ^a  

^a DRESDEN UNIVERSITY OF TECHNOLOGY   (Germany)

Author keywords

Electron holography; Inelastic mean free path; Mean inner potential

Indexed keywords

ATOMIC LAYER; DYNAMICAL SCATTERING; ELASTIC SCATTERING THEORY; INELASTIC MEAN FREE PATH; MEAN INNER POTENTIAL; OFF-AXIS; OFF-AXIS ELECTRON HOLOGRAPHY; PHASE GRATING; SCATTERING POTENTIALS; SPECIMEN THICKNESS; THERMAL MOTION;

DAMPING; ELECTRON HOLOGRAPHY;

SCATTERING;

ARTICLE; CONTROLLED STUDY; DISPERSION; ELASTICITY; ELECTRIC POTENTIAL; HOLOGRAPHY; MATHEMATICAL ANALYSIS; MOLECULAR DYNAMICS; OFF AXIS HOLOGRAPHY; THICKNESS;

EID: 77952320239     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2009.09.009     Document Type: Article

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