Electrical and optical phase transition properties of nano vanadium dioxide thin films

Guang Pu Xue Yu Guang Pu Fen Xi/Spectroscopy and Spectral Analysis

Volumn 30, Issue 4, 2010, Pages 1002-1007

  Liang, Ji Ran ^a,b   Hu, Ming ^a   Wang, Xiao Dong ^b   Li, Gui Ke ^b   Kan, Qiang ^b   Ji, An ^b   Yang, Fu Hua ^b   Liu, Jian ^b   Wu, Nan Jian ^b   Chen, Hong Da ^b  

^a TIANJIN UNIVERSITY   (China)

^b INSTITUTE OF SEMICONDUCTORS   (China)

Author keywords

Electrical phase transition; Nano VO2 thin films; Optical phase transition

Indexed keywords

DUAL ION BEAM SPUTTERING; ELECTRICAL PHASE TRANSITION; ELECTRICAL PROPERTY; FOUR-POINT PROBE METHOD; FOURIER TRANSFORM INFRARED SPECTRA; METAL PHASE; OPTICAL PHASE; OPTICAL PHASE TRANSITION; PHASE TRANSITION PROPERTIES; SEMICONDUCTOR PHASE; SEMICONDUCTOR-TO-METAL PHASE TRANSITION; THERMAL-ANNEALING; VANADIUM DIOXIDE THIN FILMS; VANADIUM OXIDE THIN FILMS; WAVEBANDS;

ELECTRIC PROPERTIES; INFRARED SPECTROSCOPY; METALS; OPTICAL FILMS; OPTICAL PROPERTIES; OXIDE FILMS; SPUTTERING; THIN FILMS; VANADIUM; VANADIUM ALLOYS; VANADIUM COMPOUNDS; VAPOR DEPOSITION;

PHASE TRANSITIONS;

EID: 77951894816     PISSN: 10000593     EISSN: None     Source Type: Journal    
DOI: 10.3964/j.issn.1000-0593(2010)04-1002-06     Document Type: Article

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