Characterization of preferred orientated vanadium dioxide film on muscovite (001) substrate

Physica Status Solidi (A) Applications and Materials Science

Volumn 205, Issue 10, 2008, Pages 2409-2412

  Yan, Jiazhen ^a   Huang, Wanxia ^a,b   Zhang, Yue ^a   Liu, Xiaojie ^a   Tu, Mingjin ^a  

^a SICHUAN UNIVERSITY   (China)

^b WARSAW UNIVERSITY OF TECHNOLOGY   (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

AQUEOUS SOLS; CLEAVAGE PLANES; DIFFRACTION PEAKS; ELECTRICAL PROPERTIES; ELECTRICAL RESISTIVITIES; INFRARED TRANSMITTANCES; PHASETRANSITION TEMPERATURES; RAY PATTERNS; THREE ORDERS OF MAGNITUDES; VANADIUM DIOXIDE FILMS; VANADIUM DIOXIDES; VANADIUM OXIDE GELS; WAVE NUMBERS;

ANNEALING; COLLOIDS; ELECTRIC PROPERTIES; ELECTRIC RESISTANCE; GELATION; GELS; MICA; SOL-GEL PROCESS; TRANSITION METALS; VANADIUM; VANADIUM ALLOYS; VANADIUM COMPOUNDS;

OXIDE FILMS;

EID: 54249094731     PISSN: 18626300     EISSN: 18626319     Source Type: Journal    
DOI: 10.1002/pssa.200779402     Document Type: Article

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