-
1
-
-
34247548849
-
10 kV,5A, 4H-SiC power DMOSFET
-
Jun.
-
S. H. Ryu, S. Krishnaswami, B. Hull, J. Richmond, A. Agarwal, and A. Hefner, "10 kV, 5 A, 4H-SiC power DMOSFET," in Proc. ISPSD, Jun. 2006, pp. 265-268.
-
(2006)
Proc. ISPSD
, pp. 265-268
-
-
Ryu, S.H.1
Krishnaswami, S.2
Hull, B.3
Richmond, J.4
Agarwal, A.5
Hefner, A.6
-
2
-
-
49249106389
-
A 10 kV large-area 4H-SiC power DMOSFET with stable subthreshold behavior independent of temperature
-
Aug.
-
R. S. Howell, S. Buchoff, S. Van Campen, T. R. McNutt, A. Ezis, B. Nechay, C. F. Kirby, M. E. Sherwin, and R. C. Clarke, "A 10 kV large-area 4H-SiC power DMOSFET with stable subthreshold behavior independent of temperature," IEEE Trans. Electron Devices, vol.55, no.8, pp. 1807-1815, Aug. 2008.
-
(2008)
IEEE Trans. Electron Devices
, vol.55
, Issue.8
, pp. 1807-1815
-
-
Howell, R.S.1
Buchoff, S.2
Van Campen, S.3
McNutt, T.R.4
Ezis, A.5
Nechay, B.6
Kirby, C.F.7
Sherwin, M.E.8
Clarke, R.C.9
-
3
-
-
63849095967
-
12 kV 4H-SiC p-IGBTs with record low specific on-resistance
-
Q. Zhang, C. Jonas, J. Sumakeris, A. Agarwal, and J. Palmour, "12 kV 4H-SiC p-IGBTs with record low specific on-resistance," Mater. Sci. Forum, vol.600-603, pp. 1187-1190, 2009.
-
(2009)
Mater. Sci. Forum
, vol.600-603
, pp. 1187-1190
-
-
Zhang, Q.1
Jonas, C.2
Sumakeris, J.3
Agarwal, A.4
Palmour, J.5
-
4
-
-
67649473706
-
Critical issues for MOS based power devices in 4H-SiC
-
S. H. Ryu, S. Das, S. Haney, A. Agarwal, A. Lelis, B. Geil, and C. Scozzie, "Critical issues for MOS based power devices in 4H-SiC," Mater. Sci. Fo r u m, vol.615-617, pp. 743-748, 2009.
-
(2009)
Mater. Sci.Forum
, vol.615-617
, pp. 743-748
-
-
Ryu, S.H.1
Das, S.2
Haney, S.3
Agarwal, A.4
Lelis, A.5
Geil, B.6
Scozzie, C.7
-
5
-
-
70350013406
-
VJFET based all-SiC normally-off cascode switch for high temperature power handling applications
-
V. Veliadis, H. Hearne, T. McNutt, M. Snook, P. Potyraj, and C. Scozzie, "VJFET based all-SiC normally-off cascode switch for high temperature power handling applications," Mater. Sci. Forum, vol.615-617, pp. 711-714, 2009.
-
(2009)
Mater. Sci. Forum
, vol.615-617
, pp. 711-714
-
-
Veliadis, V.1
Hearne, H.2
McNutt, T.3
Snook, M.4
Potyraj, P.5
Scozzie, C.6
-
6
-
-
3342949499
-
Fabrication and characterization of 11-kV normally off 4H-SiC trenched-and-implanted vertical junction FET
-
J. H. Zhao, P. Alexandrov, J. Zhang, and X. Li, "Fabrication and characterization of 11-kV normally off 4H-SiC trenched-and-implanted vertical junction FET," IEEE Electron Device Lett., vol.25, no.7, pp. 474-476, Jul. 2004.
-
(2004)
IEEE Electron Device Lett.
, vol.25
, Issue.7
, pp. 474-476
-
-
Zhao, J.H.1
Alexandrov, P.2
Zhang, J.3
Li, X.4
-
7
-
-
49249127804
-
2 1650-V normally on 4H-SiC TI-VJFET
-
Aug.
-
2 1650-V normally on 4H-SiC TI-VJFET," IEEE Trans. Electron Devices, vol.55, no.8, pp. 1880-1886, Aug. 2008.
-
(2008)
IEEE Trans. Electron Devices
, vol.55
, Issue.8
, pp. 1880-1886
-
-
Li, Y.1
Alexandrov, P.2
Zhao, J.H.3
-
8
-
-
54849375100
-
2 active area
-
Oct.
-
2 active area," IEEE Electron Device Lett., vol.29, no.10, pp. 1132-1134, Oct. 2008.
-
(2008)
IEEE Electron Device Lett.
, vol.29
, Issue.10
, pp. 1132-1134
-
-
Veliadis, V.1
McNutt, T.2
Snook, M.3
Hearne, H.4
Potyraj, P.5
Scozzie, C.6
-
9
-
-
57049174467
-
2 active area and blocking voltage capability of 94% of the SiC material limit
-
Dec.
-
2 active area and blocking voltage capability of 94% of the SiC material limit," IEEE Electron Device Lett., vol.29, no.12, pp. 1325-1327, Dec. 2008.
-
(2008)
IEEE Electron Device Lett.
, vol.29
, Issue.12
, pp. 1325-1327
-
-
Veliadis, V.1
Snook, M.2
McNutt, T.3
Hearne, H.4
Potyraj, P.5
Lelis, A.6
Scozzie, C.7
-
10
-
-
78649323699
-
High temperature electrical characteristics of 20 A, 800 v enhancement-mode SiC VJFETs
-
Albuquerque, NM
-
A. Ritenour, I. Sankin, N. Merrett, W. King, V. Bondarenko, R. Kelly, W. Draper, and D. Sheridan, "High temperature electrical characteristics of 20 A, 800 V enhancement-mode SiC VJFETs," in Proc. Int. Conf. Exhib. High Temp. Electron., Albuquerque, NM, 2008, p. 103.
-
(2008)
Proc. Int. Conf. Exhib. High Temp. Electron.
, pp. 103
-
-
Ritenour, A.1
Sankin, I.2
Merrett, N.3
King, W.4
Bondarenko, V.5
Kelly, R.6
Draper, W.7
Sheridan, D.8
-
11
-
-
39749088777
-
Normally-off SiC-JFET inverter with low- Voltage control and a high-speed drive circuit
-
DOI 10.1109/ISPSD.2007.4294971, 4294971, Proceedings of 19th International Symposium on Power Semiconductor Devices and ICs, ISPSD'07
-
K. Ishikawa, H. Onose, Y. Onose, T. Ooyanagi, T. Someya, N. Yokoyama, and H. Hozouji, "Normally-off SiC-JFET inverter with low-voltage control and a high-speed drive circuit," in Proc. 19th ISPSD ICs, Jeju, Korea, 2007,pp. 217-220. (Pubitemid 351306526)
-
(2007)
Proceedings of the International Symposium on Power Semiconductor Devices and ICs
, pp. 217-220
-
-
Ishikawa, K.1
Onose, H.2
Onose, Y.3
Ooyanagi, T.4
Someya, T.5
Yokoyama, N.6
Hozouji, H.7
-
12
-
-
34249702955
-
Silicon carbide junction field effect transistors
-
DOI 10.1142/S012915640600403X, PII S012915640600403X
-
D. Stephani and P. Friedrichs, "Silicon carbide junction field effect transistors," Int. J. High Speed Electron. Syst., vol.16, no.3, pp. 825-854, 2006. (Pubitemid 46825682)
-
(2006)
International Journal of High Speed Electronics and Systems
, vol.16
, Issue.3
, pp. 825-854
-
-
Stephani, D.1
Friedrichs, P.2
-
13
-
-
0019008406
-
Bipolar operation of power junction field effect transistors
-
B. J. Baliga, "Bipolar operation of power junction field effect transistors," Electron. Lett., vol.16, no.8, pp. 300-301, Apr. 1980. (Pubitemid 10483491)
-
(1980)
Electronics Letters
, vol.16
, Issue.8
, pp. 300-301
-
-
Baliga B.Jayant1
-
14
-
-
67650409703
-
Investigation of the suitability of 1200-V normally-off recessed-implanted-gate SiC VJFETs for efficient power switching applications
-
V. Veliadis, H. Hearne, E. J. Stewart, M. Snook, T. McNutt, R. Howell, A. Lelis, and C. Scozzie, "Investigation of the suitability of 1200-V normally-off recessed-implanted-gate SiC VJFETs for efficient power switching applications," IEEE Electron Device Lett., vol.30, no.7, pp. 736-738, Jul. 2009.
-
(2009)
IEEE Electron Device Lett.
, vol.30
, Issue.7
, pp. 736-738
-
-
Veliadis, V.1
Hearne, H.2
Stewart, E.J.3
Snook, M.4
McNutt, T.5
Howell, R.6
Lelis, A.7
Scozzie, C.8
-
15
-
-
70350019474
-
Effect of bipolar gate-to-drain current on the electrical properties of vertical junction field effect transistors
-
V. Veliadis, H. Hearne, E. J. Stewart, J. D. Caldwell, M. Snook, T. McNutt, P. Potyraj, and C. Scozzie, "Effect of bipolar gate-to-drain current on the electrical properties of vertical junction field effect transistors," Mater. Sci. Forum, vol.615-617, pp. 719-722, 2009.
-
(2009)
Mater. Sci. Forum
, vol.615-617
, pp. 719-722
-
-
Veliadis, V.1
Hearne, H.2
Stewart, E.J.3
Caldwell, J.D.4
Snook, M.5
McNutt, T.6
Potyraj, P.7
Scozzie, C.8
-
16
-
-
54849257500
-
Large area silicon carbide VJFETs for 1200 v cascode switch operation
-
Article ID 523721
-
V. Veliadis, T. McNutt, M. McCoy, H. Hearne, P. Potyraj, and C. Scozzie, "Large area silicon carbide VJFETs for 1200 V cascode switch operation," Int. J. Power Manage. Electron., vol.2008, pp. 1-8, 2008,Article ID 523721.
-
(2008)
Int. J. Power Manage. Electron.
, vol.2008
, pp. 1-8
-
-
Veliadis, V.1
McNutt, T.2
McCoy, M.3
Hearne, H.4
Potyraj, P.5
Scozzie, C.6
-
17
-
-
39749167775
-
8 kV normally-off all-SiC cascode power switch using VJFETs
-
DOI 10.1109/ISPSD.2007.4294938, 4294938, Proceedings of 19th International Symposium on Power Semiconductor Devices and ICs, ISPSD'07
-
E. J. Stewart, M. J. McCoy, T. R. McNutt, H. C. Hearne, A. P. Walker, S. D. Van Campen, G. M. Bates, S. Leslie, G. C. DeSalvo, and R. C. Clarke, "8 kV normally-off all-SiC cascode power switch using VJFETs," in Proc. 19th Int. Symp. Power Semicond. Devices ICs, 2007, pp. 85-87. (Pubitemid 351306493)
-
(2007)
Proceedings of the International Symposium on Power Semiconductor Devices and ICs
, pp. 85-87
-
-
Stewart, E.J.1
McCoy, M.J.2
McNutt, T.R.3
Hearne, H.C.4
Walker, A.P.5
Van Campen, S.D.6
Bates, G.M.7
Leslie, S.8
DeSalvo, G.C.9
Clarke, R.C.10
-
18
-
-
77951878841
-
Semiconductor structure for use in a static induction transistor having improved gate-to-drain breakdown voltage
-
May 13
-
L. S. Chen and V. Veliadis, "Semiconductor structure for use in a static induction transistor having improved gate-to-drain breakdown voltage," U.S. Patent 7 372 087, May 13, 2008.
-
(2008)
U.S. Patent
, vol.7
, pp. 372087
-
-
Chen, L.S.1
Veliadis, V.2
-
19
-
-
77951877283
-
Feasibility of efficient power switching using short-channel 1200-V normally-off SiC VJFETs; Experimental analysis and simulations
-
V. Veliadis, H. Hearne, E. J. Stewart, R. Howell, A. Lelis, and C. Scozzie, "Feasibility of efficient power switching using short-channel 1200-V normally-off SiC VJFETs; experimental analysis and simulations," Mater. Sci. Forum, vol.645-648, pp. 929-932, 2010.
-
Mater. Sci. Forum
, vol.645-648
, Issue.2010
, pp. 929-932
-
-
Veliadis, V.1
Hearne, H.2
Stewart, E.J.3
Howell, R.4
Lelis, A.5
Scozzie, C.6
-
20
-
-
33645636940
-
Status and prospects of SiC power devices
-
M. Bakowski, "Status and prospects of SiC power devices," IEEJ Trans. Ind. Appl., vol.126-D, no.4, pp. 391-399, 2006.
-
(2006)
IEEJ Trans. Ind. Appl.
, vol.126 D
, Issue.4
, pp. 391-399
-
-
Bakowski, M.1
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