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Volumn 29, Issue 10, 2008, Pages 1132-1134

A 1680-V (at 1mA/cm2) 54-A (at 780 W/cm2) normally ON 4H-SiC JFET with 0.143-cm2 active area

Author keywords

4H SiC; High current; High power; High voltage; JFET; Large area; Normally ON; Vertical channel

Indexed keywords

FIELD EFFECT TRANSISTORS;

EID: 54849375100     PISSN: 07413106     EISSN: None     Source Type: Journal    
DOI: 10.1109/LED.2008.2002907     Document Type: Article
Times cited : (40)

References (7)
  • 3
    • 34249702955 scopus 로고    scopus 로고
    • Silicon carbide junction field effect transistors
    • D. Stephani and P. Friedrichs, "Silicon carbide junction field effect transistors," Int. J. High Speed Electron. Syst., vol. 16, no. 3, pp. 825-854, 2006.
    • (2006) Int. J. High Speed Electron. Syst , vol.16 , Issue.3 , pp. 825-854
    • Stephani, D.1    Friedrichs, P.2
  • 5
    • 0017523353 scopus 로고
    • Optimum design of triode-like JFETs by two-dimensional computer simulation
    • Aug
    • K. Yamaguchi and H. Kodera, "Optimum design of triode-like JFETs by two-dimensional computer simulation," IEEE Trans. Electron Devices vol. ED-24, no. 8, pp. 1061-1069, Aug. 1977.
    • (1977) IEEE Trans. Electron Devices , vol.ED-24 , Issue.8 , pp. 1061-1069
    • Yamaguchi, K.1    Kodera, H.2
  • 6
    • 0033101253 scopus 로고    scopus 로고
    • Performance limiting surface defects in SiC epitaxial p-n junction diodes
    • Mar
    • T. Kimoto, N. Miyamoto, and H. Matsunami, " Performance limiting surface defects in SiC epitaxial p-n junction diodes," IEEE Trans. Electron Devices, vol. 46, no. 3, pp. 471-477, Mar 1999.
    • (1999) IEEE Trans. Electron Devices , vol.46 , Issue.3 , pp. 471-477
    • Kimoto, T.1    Miyamoto, N.2    Matsunami, H.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.