New techniques in SOI pixel detector

IEEE Nuclear Science Symposium Conference Record

Volumn , Issue , 2009, Pages 1161-1164

  Arai, Yasuo ^a  

^a INSTITUTE OF PARTICLE AND NUCLEAR STUDIES   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

BACK GATE EFFECTS; INTEGRATION TECHNOLOGIES; PIXEL DETECTOR; SILICON-ON-INSULATOR PROCESS;

NUCLEAR PHYSICS; PIXELS; READOUT SYSTEMS; SILICON DETECTORS;

RADIATION DETECTORS;

EID: 77951165388     PISSN: 10957863     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/NSSMIC.2009.5402397     Document Type: Conference Paper

References (11)

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8. M. Motoyoshi and M. Koyanagi, 2009 JINST 4 P03009 doi: 10.1088/1748-0221/4/03/P03009 .
9. T. Miyoshi et al., " Performance study of SOI monolithic pixel detectors for X-ray application", to be published in Nucl. Instr. and Meth.
10. F. Krummenacher, Nucl. Instr. and Meth. A305(1991)527.
11. T. Uchida, IEEE Trans. on Nucl. Sci., Vol. 55, No. 3, (2008) pp. 1631-1637.