Monitoring scanning electrochemical microscopy approach curves with mid-infrared spectroscopy: Toward a novel current-independent positioning mode

Analytical Chemistry

Volumn 82, Issue 8, 2010, Pages 3132-3138

  Wang, Liqun ^a   Kranz, Christine ^b   Mizaikoff, Boris ^b  

^a GEORGIA INSTITUTE OF TECHNOLOGY   (United States)

^b UNIVERSITY OF ULM   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION INTENSITY; APPROACH CURVE; AQUEOUS ELECTROLYTE SOLUTIONS; ATTENUATED TOTAL REFLECTION INFRARED SPECTROSCOPY; ATTENUATED TOTAL REFLECTIONS; CRYSTAL SURFACES; EVANESCENT FIELDS; IN-SITU; INTENSITY CHANGE; IR ABSORPTION SPECTRA; MID-INFRARED SPECTROSCOPY; MIDINFRARED; PENETRATION DEPTH; SAMPLE SURFACE; SCANNING ELECTROCHEMICAL MICROSCOPY; SHIELDING MATERIALS; SPECTROSCOPIC DETECTION; SURFACE MODIFICATION; ULTRAMICROELECTRODES; WATER MOLECULE; WATER SPECTRUM;

ABSORPTION SPECTROSCOPY; ELECTROLYTES; ELECTROMAGNETIC WAVE REFLECTION; INFRARED DEVICES; INFRARED SPECTROSCOPY; LITHOGRAPHY; SCANNING ELECTRON MICROSCOPY; SCANNING PROBE MICROSCOPY; SURFACES; WATER ABSORPTION;

BOROSILICATE GLASS;

ELECTROLYTE; WATER;

ARTICLE; CHEMICAL MODEL; CHEMISTRY; INFRARED SPECTROPHOTOMETRY; METHODOLOGY; MICROELECTRODE; SCANNING ELECTRON MICROSCOPY;

ELECTROLYTES; MICROELECTRODES; MICROSCOPY, ELECTRON, SCANNING; MODELS, CHEMICAL; SPECTROPHOTOMETRY, INFRARED; WATER;

EID: 77951070130     PISSN: 00032700     EISSN: None     Source Type: Journal    
DOI: 10.1021/ac902781h     Document Type: Article

References (48)

1. Wang, L., Kowalik, J., Mizaikoff, B., and Kranz, C. Anal. Chem. DOI: 10.1021/ac9027802.
2. Wittstock, G., Burchardt, M., Pust, S. E., Shen, Y., and Zhao, C. Angew. Chem., Int. Ed. 2007, 46, 1584-1617
3. Sun, P., Laforge, F. O., and Mirkin, M. V. Phys. Chem. Chem. Phys. 2007, 9, 802-823
4. Bard, A. J. and Mirkin, M. V. Scanning Electrochemical Microscopy; Marcel Dekker: New York, 2001.
5. Shin, M. and Jeon, I. C. Bull. Korean Chem. Soc. 1998, 19, 1227-1232
6. Cliffel, D. E. and Bard, A. J. Anal. Chem. 1998, 70, 1993-1998
7. Gollas, B., Bartlett, P. N., and Denuault, G. Anal. Chem. 2000, 72, 349-356
8. Hess, C., Borgwarth, K., and Heinze, J. Electrochim. Acta 2000, 45, 3725-3736
9. Gabrielli, C., Joiret, S., Keddam, M., Perrot, H., Portail, N., Rousseau, P., and Vivier, V. Electrochim. Acta 2007, 52, 7706-7714
10. Hsu, C.-Y., Vasantha, V. S., and Ho, K.-C. Electrochim. Acta 2008, 53, 6244-6251
11. Williams, D. E., Mohiuddin, T. F., and Zhu, Y. Y. J. Electrochem. Soc. 1998, 145, 2664-2672
12. Treutler, T. H. and Wittstock, G. Electrochim. Acta 2003, 48, 2923-2932
13. Casillas, N., James, P., and Smyrl, W. H. J. Electrochem. Soc. 1995, 142, L16-L18
14. Macpherson, J. V. and Unwin, P. R. Anal. Chem. 2000, 72, 276-285
15. Macpherson, J. V. and Unwin, P. R. Anal. Chem. 2001, 73, 550-557
16. Kranz, C., Friedbacher, G., Mizaikoff, B., Lugstein, A., Smoliner, J., and Bertagnolli, E. Anal. Chem. 2001, 73, 2491-2500
17. Kueng, A., Kranz, C., Lugstein, A., Bertagnolli, E., and Mizaikoff, B. Angew. Chem., Int. Ed. 2003, 42, 3238-3240
18. Davoodi, A., Pan, J., Leygraf, C., and Norgren, S. Electrochem. Solid-State Lett. 2005, 8, B21-B24
19. Fasching, R. J., Tao, Y., and Prinz, F. B. Sens. Actuators, B 2005, B108, 964-972
20. Gullo, M. R., Frederix, P. L. T. M., Akiyama, T., Engel, A., de Rooij, N. F., and Staufer, U. Anal. Chem. 2006, 78, 5436-5442
21. Lee, Y. and Bard, A. J. Anal. Chem. 2002, 74, 3626-3633
22. Maruyama, K., Ohkawa, H., Ogawa, S., Ueda, A., Niwa, O., and Suzuki, K. Anal. Chem. 2006, 78, 1904-1912
23. Evju, J. K. and Smyrl, W. H. Proc. Electrochem. Soc. 2001, 2001?22, 181-192
24. Evju, J. K. and Smyrl, W. H. Proc. Electrochem. Soc. 2002, 2000?30, 139-154
25. Boldt, F.-M., Heinze, J., Diez, M., Petersen, J., and Boersch, M. Anal. Chem. 2004, 76, 3473-3481
26. Fan, F.-R. F., Cliffel, D., and Bard, A. J. Anal. Chem. 1998, 70, 2941-2948
27. Kanoufi, F., Cannes, C., Zu, Y., and Bard, A. J. J. Phys. Chem. B 2001, 105, 8951-8962
28. Miao, W., Choi, J.-P., and Bard, A. J. J. Am. Chem. Soc. 2002, 124, 14478-14485
29. Szunerits, S. and Walt, D. R. ChemPhysChem 2003, 4, 186-192
30. Szunerits, S., Knorr, N., Calemczuk, R., and Livache, T. Langmuir 2004, 20, 9236-9241
31. Amphlett, J. L. and Denuault, G. J. Phys. Chem. B. 1998, 102, 9946-9951
32. Shao, Y. and Mirkin, M. V. J. Phys. Chem. B. 1998, 102, 9915-9921
33. Fulian, Q., Fisher, A. C., and Denuault, G. J. Phys. Chem. B. 1999, 103, 4387-4392
34. Selzer, Y. and Mandler, D. Anal. Chem. 2 000, 72, 2383-2390
35. Liljeroth, P., Johans, C., Slevin, C. J., Quinn, B. M., and Kontturi, K. Anal. Chem. 2002, 74, 1972-1978
36. Sklyar, O. and Wittstock, G. J. Phys. Chem. B 2002, 106, 7499-7508
37. Sklyar, O., Ufheil, J., Heinze, J., and Wittstock, G. Electrochim. Acta 2003, 49, 117-128
38. Zoski, C. G., Liu, B., and Bard, A. J. Anal. Chem. 2004, 76, 3646-3654
39. Combellas, C., Fuchs, A., and Kanoufi, F. Anal. Chem. 2004, 76, 3612-3618
40. Wipf, D. O., Bard, A. J., and Tallman, D. E. Anal. Chem. 1993, 65, 1373-1377
41. Alpuche-Aviles, M. A. and Wipf, D. O. Anal. Chem. 2001, 73, 4873-4881
42. Ludwig, M., Kranz, C., Schuhmann, W., and Gaub, H. E. Rev. Sci. Instrum. 1995, 66, 2857-2860
43. Buchler, M., Kelley, S. C., and Smyrl, W. H. Electrochem. Solid-State Lett. 2000, 3, 35-38
44. Katemann, B. B., Schulte, A., and Schuhmann, W. Chem. - Eur. J. 2003, 9, 2025-2033
45. Etienne, M., Anderson, E. C., Evans, S. R., Schuhmann, W., and Fritsch, I. Anal. Chem. 2006, 78, 7317-7324
46. Harrick, N. J. Internal Reflection Spectroscopy, John Wiley & Sons, Inc: New York, 1967.
47. Hansen, D. M., Albaugh, C. E., Moran, P. D., and Kuech, T. F. Appl. Phys. Lett. 2001, 79, 3413-3415
48. Taft, E. A. J. Electrochem. Soc. 1985, 132, 2486-2489