메뉴 건너뛰기




Volumn 132, Issue 15, 2010, Pages 5422-5427

Low-energy electron-induced DNA damage: Effect of base sequence in oligonucleotide trimers

Author keywords

[No Author keywords available]

Indexed keywords

BASE SEQUENCES; BOND-BREAKING; C-O BOND CLEAVAGE; CONDENSED PHASE; DNA DAMAGES; GUANINE; HPLC-UV ANALYSIS; IRRADIATED SAMPLES; LOW ENERGY ELECTRONS; MODEL COMPOUND; NON-VOLATILE; NORMAL BASIS; NUCLEOBASES; PHOSPHODIESTER BONDS; PHOSPHODIESTERS; TERMINAL SITE; TOTAL ENERGY;

EID: 77951050251     PISSN: 00027863     EISSN: 15205126     Source Type: Journal    
DOI: 10.1021/ja9099505     Document Type: Article
Times cited : (58)

References (54)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.