Low energy electron induced DNA damage: Effects of terminal phosphate and base moieties on the distribution of damage

Journal of the American Chemical Society

Volumn 130, Issue 17, 2008, Pages 5612-5613

  Li, Zejun ^a   Zheng, Yi ^a   Cloutier, Pierre ^a   Sanche, Léon ^a   Wagner, J Richard ^a  

^a UNIVERSITY OF SHERBROOKE   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

PHOSPHATE;

ARTICLE; CHEMICAL STRUCTURE; DNA DAMAGE; ELECTRON; ENERGY; HIGH PERFORMANCE LIQUID CHROMATOGRAPHY; ULTRAVIOLET RADIATION;

EID: 42649107175     PISSN: 00027863     EISSN: None     Source Type: Journal    
DOI: 10.1021/ja077601b     Document Type: Article

References (18)