Enhanced DNA damage induced by secondary electron emission from a tantalum surface exposed to soft X rays

Radiation Research

Volumn 165, Issue 3, 2006, Pages 365-371

  Cai, Zhongli ^a,b   Cloutier, Pierre ^a   Hunting, Darel ^a   Sanche, Léon ^a  

^a UNIVERSITY OF SHERBROOKE   (Canada)

^b PRINCESS MARGARET HOSPITAL   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

CIRCULAR DNA; DOUBLE STRANDED DNA; PLASMID DNA; SINGLE STRANDED DNA; TANTALUM;

AGAR GEL ELECTROPHORESIS; ARTICLE; DNA CROSS LINKING; DNA DAMAGE; ELECTRON RADIATION; HUMIDITY; LASER MICROSCOPY; PHOTON; PRIORITY JOURNAL; RADIATION DOSE; RADIODIAGNOSIS; X RAY;

DNA; DNA DAMAGE; ELECTRONS; TANTALUM; X-RAYS;

EID: 33644537018     PISSN: 00337587     EISSN: None     Source Type: Journal    
DOI: 10.1667/RR3509.1     Document Type: Article

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