Hard X-ray photoelectron spectroscopy from 5-14.5 keV

Solid State Communications

Volumn 132, Issue 9, 2004, Pages 589-594

  Thiess, S ^a   Kunz, C ^b   Cowie, B C C ^a   Lee, T L ^a   Renier, M ^a   Zegenhagen, J ^a  

^a EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^b UNIVERSITY OF HAMBURG   (Germany)

Author keywords

A. Surfaces and interfaces; D. Photoelectric cross section; E. Photoelectron spectroscopies; E. Synchrotron radiation; E. X ray and X ray spectroscopies

Indexed keywords

ANISOTROPY; ELECTRODES; ELECTRONS; INTERFACES (MATERIALS); LENSES; PHOTOEMISSION; SYNCHROTRON RADIATION; X RAY DIFFRACTION;

PHOTOELECTRIC CROSS-SECTION; SURFACES AND INTERFACES; X-RAY AND X-RAY SPECTROSCOPIES; X-RAY INTENSITY;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 12444323640     PISSN: 00381098     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ssc.2004.09.021     Document Type: Article

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