Hard X-ray photoelectron spectroscopy: Sensitivity to depth, chemistry and orbital character

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 547, Issue 1, 2005, Pages 113-123

  Dallera, C ^a   Braicovich, L ^a   Duo L ^a   Palenzona, A ^b   Panaccione, G ^c   Paolicelli, G ^d   Cowie, B C C ^e   Zegenhagen, J ^e  

^a POLITECNICO DI MILANO   (Italy)

^b INFM   (Italy)

^c LABORATORIO TASC   (Italy)

^d ROMA TRE UNIVERSITY   (Italy)

^e EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

Author keywords

Attenuation length; Cross sections; Hard X rays; Photoelectron spectroscopy

Indexed keywords

ELECTROMAGNETIC WAVE ATTENUATION; KINETIC ENERGY; LIGHT EMISSION; PHOTONS; SENSITIVITY ANALYSIS; SYNCHROTRON RADIATION; X RAYS;

ATTENUATION LENGTHS; CROSS-SECTIONS; HARD X-RAYS; VALENCE BANDS;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 22144461060     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2005.05.017     Document Type: Conference Paper

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