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Volumn 15, Issue 1, 2007, Pages 79-86

Probing buried interfaces by simultaneous combination of X-ray diffraction (SXRD) and hard X-ray photoelectron spectroscopy (HAXPES, up to 15 KeV)

(2) Rubio Zuazo, J a,b Castro, G R a,b

a EUROPEAN SYNCHROTRON RADIATION FACILITY (France)

b INSTITUTO DE CIENCIA DE MATERIALES DE MADRID (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL PROPERTIES; ELECTRONIC PROPERTIES; PHOTOELECTRONS; PHOTONS; STRUCTURE (COMPOSITION); SYNCHROTRON RADIATION; X RAY DIFFRACTION ANALYSIS; X RAY PHOTOELECTRON SPECTROSCOPY;

ENERGY ANALYZER; HARD X-RAY PHOTOELECTRON SPECTROSCOPY; SURFACE X-RAY DIFFRACTION;

PROBES;

EID: 38549146022 PISSN: 16065131 EISSN: None Source Type: Journal
DOI: None Document Type: Conference Paper

Times cited : (15)

References (13)

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2
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4
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6
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- J. Rubio-Zuazo and G.R. Castro // Nucl. Instr, Meth A 547 (2005) 64.
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- Rubio-Zuazo, J.¹ Castro, G.R.²

7
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- in press
- J. Rubio-Zuazo and G.R. Castro // Rev. Sci. Instr, in press.
- Rev. Sci. Instr
- Rubio-Zuazo, J.¹ Castro, G.R.²

8
- 0042013004
- A. de Andrés, J. Rubio, G.R. Castro, S. Taboada, J.L Martínez and J.M. Colino // Appl Phys. Lett 83 (2003) 713.
- (2003) Appl Phys. Lett , vol.83 , pp. 713
- de Andrés, A.¹ Rubio, J.² Castro, G.R.³ Taboada, S.⁴ Martínez, J.L.⁵ Colino, J.M.⁶

9
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- Rubio-Zuazo, J.¹ de Andrés, A.² Taboada, S.³ Prieto, C.⁴ Martínez, J.L.⁵ Castro, G.R.⁶

10
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13
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