Microstructural properties of multi-nano-layered YSZ thin films

Journal of Alloys and Compounds

Volumn 495, Issue 2, 2010, Pages 629-633

  Amezaga Madrid P ^a   Antunez Flores W ^a   Gonzalez Hernandez J ^a   Saenz Hernandez J ^a   Campos Venegas, K ^a   Solis Canto O ^a   Ornelas Gutierrez C ^a   Vega Becerra, O ^a   Martinez Sanchez R ^a   Miki Yoshida, M ^a  

^a CENTRO DE INVESTIGACIÓN EN MATERIALES AVANZADOS   (Mexico)

Author keywords

Nanostructures; Scanning and transmission electron microscopy; Thin films; Vapour deposition; X ray diffraction

Indexed keywords

BRAGG REFLECTION; CHARACTERISTIC PEAKS; CUBIC PHASE; CUBIC ZIRCONIA; GRAZING-INCIDENCE X-RAY DIFFRACTION; HIGH-ANGLE ANNULAR DARK FIELDS; INTERPLANAR DISTANCE; LATTICE FRINGES; LATTICE PARAMETERS; MICROSTRUCTURAL PROPERTIES; MULTI-LAYERED STRUCTURE; PEAK BROADENING; PERIODIC STACKS; SATELLITE PEAKS; SCANNING AND TRANSMISSION ELECTRON MICROSCOPY; SELECTED AREA ELECTRON DIFFRACTION; SUBMICRON; VAPOUR DEPOSITION; X-RAY REFLECTOMETRY; YSZ THIN FILMS; YTTRIA-STABILIZED ZIRCONIA THIN FILMS;

CHEMICAL VAPOR DEPOSITION; DEPOSITION; ELECTRONS; MICROSTRUCTURE; NANOSTRUCTURES; SCANNING ELECTRON MICROSCOPY; THIN FILMS; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS; YTTRIA STABILIZED ZIRCONIA; ZIRCONIA;

HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY;

EID: 77950961935     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jallcom.2009.10.257     Document Type: Article

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