Synthesis, structural characterization and optical properties of multilayered Yttria-stabilized ZrO2 thin films obtained by aerosol assisted chemical vapour deposition

Thin Solid Films

Volumn 516, Issue 23, 2008, Pages 8282-8288

  Amezaga Madrid P ^a   Antunez Flores W ^a   Monarrez Garcia I ^a   Gonzalez Hernandez J ^a   Martinez Sanchez R ^a   Miki Yoshida, M ^a  

^a CENTRO DE INVESTIGACIÓN EN MATERIALES AVANZADOS   (Mexico)

Author keywords

AFM; Multilayered films; Optical properties; TEM; YSZ

Indexed keywords

ATOMIC FORCE MICROSCOPY; CHEMICAL VAPOR DEPOSITION; ENERGY ABSORPTION; GEOMETRICAL OPTICS; IMAGING TECHNIQUES; MICROSCOPIC EXAMINATION; MICROSTRUCTURE; OPTICAL MATERIALS; OPTICAL PROPERTIES; OXIDE FILMS; REFRACTIVE INDEX; SCANNING PROBE MICROSCOPY; SEMICONDUCTING CADMIUM TELLURIDE; THICK FILMS; YTTRIUM ALLOYS; ZIRCONIA; ZIRCONIUM;

AEROSOL-ASSISTED CHEMICAL VAPOUR DEPOSITION; AFM; ALTERNATING LAYERS; BULK VALUES; CROSS-SECTIONAL MICROSTRUCTURE; DENSE LAYER; EFFECTIVE REFRACTIVE INDEX; GLASS SUBSTRATES; MULTI-LAYERED; MULTI-LAYERED STRUCTURES; MULTILAYERED FILMS; MULTILAYERED MICROSTRUCTURE; OXIDE THIN FILMS; POROUS LAYERS; REFLECTANCE SPECTROSCOPY; REFRACTION-INDEX; STRUCTURAL CHARACTERIZATIONS; TEM; YSZ;

BOROSILICATE GLASS;

EID: 50849089294     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2008.03.022     Document Type: Article

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