Adaptive quantum measurement for low-dose electron microscopy

Physical Review A - Atomic, Molecular, and Optical Physics

Volumn 81, Issue 4, 2010, Pages

  Okamoto, Hiroshi ^a,b  

^a TOHOKU UNIVERSITY   (Japan)

^b AKITA PREFECTURAL UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

A-PLANE; BACK FOCAL PLANES; CRYO-ELECTRON MICROSCOPY; ELECTRON DOSE; ELECTROSTATIC MIRROR; LOW DOSE; NUMBER OF ELECTRONS; OBJECTIVE LENS; PHASE CONTRASTS; PHASE-CONTRAST MICROSCOPY; QUANTUM MEASUREMENT; RESOLUTION IMPROVEMENT; STATISTICAL NOISE; STRUCTURAL INFORMATION;

ELECTROSTATIC LENSES;

SCANNING ELECTRON MICROSCOPY;

EID: 77950666348     PISSN: 10502947     EISSN: 10941622     Source Type: Journal    
DOI: 10.1103/PhysRevA.81.043807     Document Type: Article

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