A quantum mechanical scheme to reduce radiation damage in electron microscopy

Applied Physics Letters

Volumn 88, Issue 16, 2006, Pages

  Okamoto, Hiroshi ^a   Latychevskaia, Tatiana ^a   Fink, Hans Werner ^a  

^a UNIVERSITY OF ZURICH   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFRACTIVE OPTICS; ELECTRON MICROSCOPY; ELECTRON TRANSITIONS; OPTICAL PROPERTIES; PROBLEM SOLVING; QUANTUM THEORY;

BIOLOGICAL SPECIMENS; ELECTRON WAVE FRONT; OPTICAL IMPLEMENTATION; QUANTUM MECHANICAL PRINCIPLES;

RADIATION DAMAGE;

EID: 33646179436     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2191096     Document Type: Article

References (10)

1. R. Henderson, Q. Rev. Biophys. 28, 171 (1995).
2. Such conversion schemes have been studied in the optical image recognition context. See, e.g., Smart Imaging Systems, edited by, B. Javidi, (SPIE, Bellingham, WA, 2001).
3. Such conversion schemes have been studied in the optical image recognition context. See, e.g., Smart Imaging Systems, edited by, B. Javidi, (SPIE, Bellingham, WA, 2001).
4. J. Miao, T. Ohsuna, O. Terasaki, K. O. Hodfson, and M. A. O'Keefe, Phys. Rev. Lett. 89, 155502 (2002).
5. Y. Ito, A. L. Bleloch, and L. M. Brown, Nature (London) 394, 49 (1998).
6. H.-W. Fink, W. Stocker, and H. Schmid, Phys. Rev. Lett. 65, 1204 (1990).
7. P. Penczek, M. Radermacher, and J. Frank, Ultramicroscopy 40, 33 (1992).
8. H. Stahlberg, Ph.D. thesis, Ecole Polytechnique Federale de Laussanne (EPFL), 1997.
9. A. Harscher and H. Lichte, in Proceedings of the 14th International Congress on Electron Microscopy, Cancun, Mexico, 1998, edited by, M. J. Yacaman, (Institute of Physics, Bristol, 1998), Vol. 1, p. 553.
10. NIST Standard Reference Database 71, Version 1.1, 2000.