Noise suppression by active optics in low-dose electron microscopy

Applied Physics Letters

Volumn 92, Issue 6, 2008, Pages

  Okamoto, Hiroshi ^a  

^a TOHOKU UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; ELECTRON MICROSCOPY; OPTICAL RESOLVING POWER; QUANTUM THEORY; RADIATION;

CASTAING-HENRY DEVICE; INHERENTLY WEAK SIGNAL;

NOISE ABATEMENT;

EID: 39349096327     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2870097     Document Type: Article

References (12)

1. R. M. Glaeser and K. A. Taylor, J. Microsc. JMICAR 0022-2720 112, 127 (1978); M. Adrian, J. Dubochet, J. Lepault, and A. W. McDowall, Nature (London) NATUAS 0028-0836 10.1038/308032a0 308, 32 (1984).
2. R. Henderson, Q. Rev. Biophys. QURBAW 0033-5835 28, 171 (1995).
3. S. Massar, G. Mitchison, and S. Pironio, Phys. Rev. A PLRAAN 1050-2947 10.1103/PhysRevA.64.062302 64, 062302 (2001); A. Kent and D. Wallace, arXiv:quant-ph/0102118.
4. H. Okamoto, T. Latychevskaia, and H.-W. Fink, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.2191096 88, 164103 (2006).
5. R. Danev and K. Nagayama, Ultramicroscopy ULTRD6 0304-3991 112, 127 (1978); E. Majorovits, B. Barton, K. Schultheiss, F. Perez-Willard, D. Gerthsen, and R. R. Schroder, Ultramicroscopy ULTRD6 0304-3991 117, 213 (2007).
6. H. W. Mook, P. E. Baston, and D. Kruit, Proceedings of the 12th European Congress on Electron Microscopy, 2000 (unpublished), Vol. 3, p. 315.
7. R. Castaing and L. Henry, J. Microsc. (Paris) ZZZZZZ 0021-7921 3, 133 (1964); G. F. Rempfer, J. Appl. Phys. JAPIAU 0021-8979 10.1063/1.345212 67, 6027 (1990); D. Preikszas and H. Rose, J. Electron Microsc. JELJA7 0022-0744 1, 1 (1997); W. Wan, J. Feng, H. A. Padmore, and D. S. Robin, Nucl. Instrum. Methods Phys. Res. A NIMAER 0168-9002 10.1016/j.nima.2003.11.159 519, 222 (2004).
8. P. Schmid, J. Feng, H. Padmore, D. Robin, H. Rose, R. Schlueter, W. Wan, E. Forest, and Y. Wu, Rev. Sci. Instrum. RSINAK 0034-6748 10.1063/1.1841871 76, 023302 (2005).
9. K. H. Hermann, D. Krahl, and U. Rindfleisch, Siemens Forsch.- Entwicklungsber. SFEBBL 0370-9736 1, 67 (1972); A. Tonomura, J. Endo, T. Matsuda, T. Kawasaki, and H. Ezawa, Am. J. Phys. AJPIAS 0002-9505 10.1119/1.16104 57, 117 (1989).
10. H. Lichte and G. Mollenstedt, J. Phys. E JPSIAE 0022-3735 10.1088/0022-3735/12/10/014 12, 941 (1979).
11. N. Ban, P. Nissen, J. Hansen, P. B. Moore, and T. A. Steiz, Science SCIEAS 0036-8075 10.1126/science.289.5481.905 289, 905 (2000).
12. R. G. Hart, Science SCIEAS 0036-8075 10.1126/science.159.3822.1464 159, 1464 (1968); W. Baumeister, Biol. Chem. BICHF3 1431-6730 10.1515/BC.2004.113 385, 865 (2004).