A new method of depth sensitive micro-X-ray fluorescence analysis

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 248, Issue 1, 2006, Pages 142-149

  Bjeoumikhov, A ^a   Bjeoumikhova, S ^b   Wedell, R ^c   Gubzhokov, R ^d   Margushev, Z ^d  

^a Institute for Scientific Instruments GmbH   (Germany)

^b BAM FEDERAL INSTITUTE FOR MATERIALS RESEARCH AND TESTING   (Germany)

^c LEIBNIZ INSTITUT FÜR KATALYSE E V AN DER UNIVERSITÄT ROSTOCK   (Germany)

^d Institute of Computer Science and Problems of Regional Management   (Russian Federation)

Author keywords

Capillary optics; Depth sensitive; Knife edge method; Micro X ray fluorescence analysis; Profiling of surface roughness

Indexed keywords

OPTICAL DEVICES; OPTICS; PROFILOMETRY; SURFACE ROUGHNESS; X RAY ANALYSIS;

CAPILLARY OPTICS; DEPTH SENSITIVE; KNIFE-EDGE METHOD; MICRO-X-RAY FLUORESCENCE ANALYSIS; PROFILING OF SURFACE ROUGHNESS;

FLUORESCENCE;

EID: 33744946522     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2006.03.173     Document Type: Article

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