Statistical compact modeling of variations in nano MOSFETs

International Symposium on VLSI Technology, Systems, and Applications, Proceedings

Volumn , Issue , 2008, Pages 165-166

  Lin, Chung Hsun ^a   Dunga, Mohan V ^a   Lu, Darsen ^a   Niknejad, Ali M ^a   Hu, Chenming ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ARCHITECTURAL ACOUSTICS; ASSOCIATIVE STORAGE; ELECTRICAL ENGINEERING; PULSE AMPLITUDE MODULATION; SECURITY SYSTEMS; TECHNOLOGY;

APPLICATION-SPECIFIC; INTERNATIONAL SYMPOSIUM; MC SIMULATIONS; NANO-MOSFETS; STATISTICAL COMPACT MODELING; VLSI TECHNOLOGIES;

PNEUMATIC DRIVES;

EID: 49049101564     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/VTSA.2008.4530849     Document Type: Conference Paper

References (6)

1. J. Power et. al., EEEE Trans. Semi. Manufacturing, p. 306, 1994
2. J. Chen et. al., Proc. ISSCC, p. 90, 1998
3. J. Chen et. al., Proc. IEDM, p. 635, 1996
4. W. Zhao et. al., Proc. ISQED, p. 589, 2006
5. A. Asenov et. al., IEEE Trans. Electron Device 50, p. 1837, 2003
6. M. Kanno et. al., Proc. VLSI Tech., p. 88, 2007