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Volumn 30, Issue 8, 2009, Pages 873-875
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Correlating microscopic and macroscopic variation with surface-potential compact model
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Author keywords
Compact model; Macroscopic; Microscopic; Model parameters; MOSFET; Surface potential; Variation
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Indexed keywords
COMPACT MODEL;
MACROSCOPIC;
MICROSCOPIC;
MODEL PARAMETERS;
MOSFET;
VARIATION;
CIRCUIT SIMULATION;
DEGRADATION;
MOSFET DEVICES;
POWDERS;
SURFACE POTENTIAL;
SURFACE PROPERTIES;
CARRIER MOBILITY;
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EID: 68249161194
PISSN: 07413106
EISSN: None
Source Type: Journal
DOI: 10.1109/LED.2009.2024441 Document Type: Article |
Times cited : (13)
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References (7)
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