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Volumn 30, Issue 8, 2009, Pages 873-875

Correlating microscopic and macroscopic variation with surface-potential compact model

Author keywords

Compact model; Macroscopic; Microscopic; Model parameters; MOSFET; Surface potential; Variation

Indexed keywords

COMPACT MODEL; MACROSCOPIC; MICROSCOPIC; MODEL PARAMETERS; MOSFET; VARIATION;

EID: 68249161194     PISSN: 07413106     EISSN: None     Source Type: Journal    
DOI: 10.1109/LED.2009.2024441     Document Type: Article
Times cited : (13)

References (7)
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    • Reducing variation in advanced logic technologies: Approaches to process and design for manufacturability of nanoscale CMOS
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    • (2007) IEDM Tech. Dig , pp. 471-474
    • Kuhn, K.J.1
  • 2
    • 68249149827 scopus 로고    scopus 로고
    • Online. Available
    • BSIM4 Compact Model Summary, Online. Available: http://wwwdevice. eecs.berkeley.edu/~bsim3/bsim4.html
    • BSIM4 Compact Model Summary
  • 3
    • 33750600861 scopus 로고    scopus 로고
    • New generation of predictive technology model for sub-45 nm early design exploration
    • Nov
    • W. Zhao and Y. Cao, "New generation of predictive technology model for sub-45 nm early design exploration," IEEE Trans. Electron Devices vol. 53, no. 11, pp. 2816-2823, Nov. 2006.
    • (2006) IEEE Trans. Electron Devices , vol.53 , Issue.11 , pp. 2816-2823
    • Zhao, W.1    Cao, Y.2
  • 4
    • 44949227132 scopus 로고    scopus 로고
    • MOSFET performance scaling - Part I: Historical trends
    • Jun
    • A. Khakifirooz and D. A. Antoniadis, "MOSFET performance scaling - Part I: Historical trends," IEEE Trans. Electron Devices, vol. 55, no. 6, pp. 1391-1400, Jun. 2008.
    • (2008) IEEE Trans. Electron Devices , vol.55 , Issue.6 , pp. 1391-1400
    • Khakifirooz, A.1    Antoniadis, D.A.2
  • 7
    • 33947170507 scopus 로고    scopus 로고
    • G. Gildenblat, X. Li, W. Wu, H. Wang, A. Jha, R. van Langevelde, G. D. J. Smit, A. J. Scholten, and D. B. M. Klaassen, PSP: An advanced surface-potential-based MOSFET model for circuit simulation, IEEE Trans. Electron Devices, 53, no. 9, pp. 1979-1993, Sep. 2006.
    • G. Gildenblat, X. Li, W. Wu, H. Wang, A. Jha, R. van Langevelde, G. D. J. Smit, A. J. Scholten, and D. B. M. Klaassen, "PSP: An advanced surface-potential-based MOSFET model for circuit simulation," IEEE Trans. Electron Devices, vol. 53, no. 9, pp. 1979-1993, Sep. 2006.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.