Relaxation oscillations in chalcogenide phase change memory

Journal of Applied Physics

Volumn 107, Issue 5, 2010, Pages

  Nardone, M ^a   Karpov, V G ^a   Karpov, I V ^b  

^a UNIVERSITY OF TOLEDO   (United States)

^b INTEL CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

APPLIED VOLTAGES; CURRENT OSCILLATION; DRIFT COEFFICIENT; EXPERIMENTAL STUDIES; INDUCED NUCLEATION; LOAD RESISTANCES; NUMERICAL MODELS; OSCILLATION PATTERNS; PHYSICAL MECHANISM; RELAXATION OSCILLATION; RESET VOLTAGE; STOCHASTIC NATURE; TEMPORAL DRIFTS; THERMALLY INDUCED; TIME CONSTANTS;

CIRCUIT OSCILLATIONS; NUCLEATION;

PHASE CHANGE MEMORY;

EID: 77949746344     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3329387     Document Type: Article

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