Photoluminescence fatigue and related degradation in thin-film photovoltaics

Journal of Applied Physics

Volumn 94, Issue 6, 2003, Pages 3901-3906

  Shvydka, Diana ^a   Verzella, C ^a   Karpov, V G ^a   Compaan, A D ^a  

^a UNIVERSITY OF TOLEDO   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

LASER BEAMS; PHOTOLUMINESCENCE; PHOTOVOLTAIC CELLS; SOLAR CELLS;

THIN-FILM PHOTOVOLTAICS;

THIN FILM DEVICES;

EID: 0141990555     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1601687     Document Type: Article

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23. Our consideration does not describe degradation under significant reverse bias, which mechanism can be different (for example, electromigration or localized charge carrier generation through the Frantz - Keldysh effect).
24. Linear rescaling was performed in such a way, that initial and final data points were superposed for all three degradation curves. In particular, the final relative degradation in Fig. 8 does not show the actual efficiency and electron-beam-induced current degradation absolute values.