Effect of carbon incorporation on the microstructure of BCxN (x = 0.25, 1, and 4) ternary solid solutions studied by transmission electron microscopy

Chemistry of Materials

Volumn 22, Issue 6, 2010, Pages 1949-1951

  Caretti, I ^a   Torres, R ^a   Gago, R ^a   Landa Canovas A R ^a   Jimenez I ^a  

^a INSTITUTO DE CIENCIA DE MATERIALES DE MADRID   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS PHASE; ATOMIC STRUCTURE; BONDING STRUCTURE; BORON CARBO-NITRIDE; C ATOMS; CARBON INCORPORATION; EELS SPECTRA; ELECTRON ANALYZER; N-COMPOUNDS; ROOM TEMPERATURE; TEM (TRANSMISSION ELECTRON MICROSCOPY); TERNARY COMPOUNDS; XANES;

ATOMIC SPECTROSCOPY; BORON; BORON COMPOUNDS; CARBON NITRIDE; CRYSTAL ATOMIC STRUCTURE; ELECTRONS; ENERGY DISSIPATION; ION BEAM ASSISTED DEPOSITION; OXYGEN; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTING SILICON COMPOUNDS; SILICON WAFERS; TRANSMISSION ELECTRON MICROSCOPY;

ELECTRON ENERGY LOSS SPECTROSCOPY;

EID: 77949553318     PISSN: 08974756     EISSN: 15205002     Source Type: Journal    
DOI: 10.1021/cm9038472     Document Type: Article

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