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Volumn 54, Issue 5, 2010, Pages 520-523

Compact capacitance modeling of a 3-terminal FET at zero drain-source voltage

Author keywords

Compact device modeling; Double Gate MOSFETs; Multi Gate MOSFETs

Indexed keywords

ANALYTIC EXPRESSIONS; BENCHMARK TESTS; C-V CHARACTERISTIC; CAPACITANCE MODEL; CAPACITANCE MODELING; CHARGE CONTROL MODEL; COMPACT DEVICE MODELING; COMPACT MODEL; COMPACT MODELING; DOUBLE-GATE; DOUBLE-GATE MOSFETS; DRAIN CHARGE; DRAIN VOLTAGE; DRAIN-SOURCE VOLTAGE; MOSFETS; SHEET DENSITY; SURROUNDING-GATE; TERMINAL DEVICES;

EID: 77949278380     PISSN: 00381101     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.sse.2009.12.039     Document Type: Article
Times cited : (5)

References (7)
  • 1
    • 33646033169 scopus 로고    scopus 로고
    • An analytic potential model for symmetric and asymmetric DG MOSFETs
    • Lu H., and Taur Y. An analytic potential model for symmetric and asymmetric DG MOSFETs. IEEE Trans Electron Dev 53 (2006) 1161-1168
    • (2006) IEEE Trans Electron Dev , vol.53 , pp. 1161-1168
    • Lu, H.1    Taur, Y.2
  • 2
    • 33947613045 scopus 로고    scopus 로고
    • Analytic charge model for Surrounding-Gate MOSFETs
    • Yu B., Lu W.-Y., Lu H., and Taur Y. Analytic charge model for Surrounding-Gate MOSFETs. IEEE Trans Electron Dev 54 3 (2007)
    • (2007) IEEE Trans Electron Dev , vol.54 , Issue.3
    • Yu, B.1    Lu, W.-Y.2    Lu, H.3    Taur, Y.4
  • 3
    • 33846090120 scopus 로고    scopus 로고
    • Analytical charge and capacitance models of undoped cylindrical surrounding gate MOSFETs
    • Moldovan O., Iñiguez B., Jiménez D., and Roig J. Analytical charge and capacitance models of undoped cylindrical surrounding gate MOSFETs. IEEE Trans Electron Dev 54 1 (2007) 162-165
    • (2007) IEEE Trans Electron Dev , vol.54 , Issue.1 , pp. 162-165
    • Moldovan, O.1    Iñiguez, B.2    Jiménez, D.3    Roig, J.4
  • 5
    • 33846100229 scopus 로고    scopus 로고
    • Validation of MOSFET model drain-source symmetry
    • McAndrew C.C. Validation of MOSFET model drain-source symmetry. IEEE Trans Electron Dev 53 9 (2006) 2202-2206
    • (2006) IEEE Trans Electron Dev , vol.53 , Issue.9 , pp. 2202-2206
    • McAndrew, C.C.1
  • 7
    • 49249112674 scopus 로고    scopus 로고
    • A unified analytic drain current model for multiple-gate MOSFETs
    • Yu B., Song J., Yuan Y., Lu W.-Y., and Taur Y. A unified analytic drain current model for multiple-gate MOSFETs. IEEE Trans Electron Dev 55 (2008) 2157-2163
    • (2008) IEEE Trans Electron Dev , vol.55 , pp. 2157-2163
    • Yu, B.1    Song, J.2    Yuan, Y.3    Lu, W.-Y.4    Taur, Y.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.