-
1
-
-
44449086461
-
New 3-E chip stacking architectures by wire-on-bump and bump-on-flex
-
May
-
B.-W. Lee, J.-Y. Tsai, H. Jin, C. K. Yoon, and R. R. Tummala, "New 3-E chip stacking architectures by wire-on-bump and bump-on-flex," IEEE Trans. Adv. Packag., vol. 31, no. 2, pp. 367-376, May 2008.
-
(2008)
IEEE Trans. Adv. Packag
, vol.31
, Issue.2
, pp. 367-376
-
-
Lee, B.-W.1
Tsai, J.-Y.2
Jin, H.3
Yoon, C.K.4
Tummala, R.R.5
-
2
-
-
24644495782
-
Three-dimensional system-in-package using stacked silicon platform technology
-
Aug
-
V. Kripesh, S. W. Yoon, V. P. Ganesh, N. Khan, M. D. Rotaru, F. Wang, and M. K. Iyer, "Three-dimensional system-in-package using stacked silicon platform technology," IEEE Trans. Adv. Packag., vol. 28, no. 3, pp. 377-386, Aug. 2005.
-
(2005)
IEEE Trans. Adv. Packag
, vol.28
, Issue.3
, pp. 377-386
-
-
Kripesh, V.1
Yoon, S.W.2
Ganesh, V.P.3
Khan, N.4
Rotaru, M.D.5
Wang, F.6
Iyer, M.K.7
-
3
-
-
0033348205
-
A 3-D stacked chip packaging solution for miniaturized massively parallel processing
-
Aug
-
R. M. Lea, I. P. Jalowiecki, D. K. Boughton, J. S. Yamaguchi, A. A. Pepe, V. H. Ozguz, and J. C. Carson, "A 3-D stacked chip packaging solution for miniaturized massively parallel processing," IEEE Trans. Adv. Packag., vol. 22, no. 3, pp. 424-432, Aug. 1999.
-
(1999)
IEEE Trans. Adv. Packag
, vol.22
, Issue.3
, pp. 424-432
-
-
Lea, R.M.1
Jalowiecki, I.P.2
Boughton, D.K.3
Yamaguchi, J.S.4
Pepe, A.A.5
Ozguz, V.H.6
Carson, J.C.7
-
5
-
-
34250351934
-
Future memory devices - From stacked memory, gain memory, single-electron memory to molecular memory
-
Apr
-
K. Nakazato, "Future memory devices - From stacked memory, gain memory, single-electron memory to molecular memory," in Proc. 2006 Int. Symp. VLSI Technol., Syst., Appl., Apr. 2006, pp. 1-2.
-
(2006)
Proc. 2006 Int. Symp. VLSI Technol., Syst., Appl
, pp. 1-2
-
-
Nakazato, K.1
-
6
-
-
34748871571
-
Moving away from silicon: The role of interconnect in new memory technologies
-
Burlingame, CA, Jun. 4-6
-
D. J. Wouters, "Moving away from silicon: The role of interconnect in new memory technologies," in Proc. IEEE Int. Interconnect Technol. Conf., Burlingame, CA, Jun. 4-6, 2007, pp. 169-171.
-
(2007)
Proc. IEEE Int. Interconnect Technol. Conf
, pp. 169-171
-
-
Wouters, D.J.1
-
7
-
-
0041369612
-
Parametric design and reliability analysis of wire interconnect technology wafer level packaging
-
Sep
-
Y. T. Lin, C. T. Peng, and K. N. Chiang, "Parametric design and reliability analysis of wire interconnect technology wafer level packaging," J. Electron. Packag., vol. 124, no. 3, pp. 234-239, Sep. 2002.
-
(2002)
J. Electron. Packag
, vol.124
, Issue.3
, pp. 234-239
-
-
Lin, Y.T.1
Peng, C.T.2
Chiang, K.N.3
-
8
-
-
32444451189
-
An overview ofelectrical characterization techniques and theory for IC packages and interconnects
-
Feb
-
E. McGibney and J. Barrett, "An overview ofelectrical characterization techniques and theory for IC packages and interconnects," IEEE Trans. Adv. Packag., vol. 29, no. 1, pp. 131-139, Feb. 2006.
-
(2006)
IEEE Trans. Adv. Packag
, vol.29
, Issue.1
, pp. 131-139
-
-
McGibney, E.1
Barrett, J.2
-
9
-
-
44449092639
-
40-Gb/s package design using wire-bonded plastic ball grid array
-
May
-
D. Kam and J. Kim, "40-Gb/s package design using wire-bonded plastic ball grid array," IEEE Trans. Adv. Packag., vol. 31, no. 2, pp. 258-266, May 2008.
-
(2008)
IEEE Trans. Adv. Packag
, vol.31
, Issue.2
, pp. 258-266
-
-
Kam, D.1
Kim, J.2
-
10
-
-
0000097438
-
Characteristic impedance of integrated circuit bond wires (short paper)
-
Sep
-
R. H. Caverly, "Characteristic impedance of integrated circuit bond wires (short paper)," IEEE Trans. Microwave Theory Tech., vol. 34, no. 9, pp. 982-984, Sep. 1986.
-
(1986)
IEEE Trans. Microwave Theory Tech
, vol.34
, Issue.9
, pp. 982-984
-
-
Caverly, R.H.1
-
11
-
-
36749052413
-
Suppression of power/ground inductive impedance and simultaneous switching noise using silicon through-via in a 3-D stacked chip package
-
Dec
-
C. Ryu, J. Park, J. S. Pak, K. Lee, T. Oh, and J. Kim, "Suppression of power/ground inductive impedance and simultaneous switching noise using silicon through-via in a 3-D stacked chip package," IEEE Microwave Wireless Compon. Lett., vol. 17, no. 12, pp. 855-857, Dec. 2007.
-
(2007)
IEEE Microwave Wireless Compon. Lett
, vol.17
, Issue.12
, pp. 855-857
-
-
Ryu, C.1
Park, J.2
Pak, J.S.3
Lee, K.4
Oh, T.5
Kim, J.6
-
12
-
-
65349182054
-
Microstrip mismatching technique for reducing SSN in high speed integrated circuit
-
Jun
-
H.-F. Huang, Q.-X. Chu, and J.-K. Xiao, "Microstrip mismatching technique for reducing SSN in high speed integrated circuit," IEEE Trans. Compon. Packag. Technol., vol. 31, no. 2, pp. 439-443, Jun. 2008.
-
(2008)
IEEE Trans. Compon. Packag. Technol
, vol.31
, Issue.2
, pp. 439-443
-
-
Huang, H.-F.1
Chu, Q.-X.2
Xiao, J.-K.3
-
13
-
-
33845566357
-
Analysis of fully buffered DIMM interface in highspeed server applications
-
May
-
B. Mutnury, M. Cases, P. Nam, D. N. de Araujo, E. Matoglu, P. Patel, and B. Herrman, "Analysis of fully buffered DIMM interface in highspeed server applications," in Proc. 56th Electron. Compon. Technol. Conf., May 2006, pp. 203-208.
-
(2006)
Proc. 56th Electron. Compon. Technol. Conf
, pp. 203-208
-
-
Mutnury, B.1
Cases, M.2
Nam, P.3
de Araujo, D.N.4
Matoglu, E.5
Patel, P.6
Herrman, B.7
-
14
-
-
77949266304
-
-
UT-013/UT-020 Data Sheet [Online, Available
-
UT-013/UT-020 Data Sheet [Online]. Available: http://www.micro-coax.com
-
-
-
-
15
-
-
77949271104
-
Off-chip coaxial to microstrip transition using MEMS trench
-
presented at the, ID, Jun
-
B. LaMeres and C. McIntosh, "Off-chip coaxial to microstrip transition using MEMS trench," presented at the NASA Symp. VLSI Design, Post Falls, ID, Jun. 2007.
-
(2007)
NASA Symp. VLSI Design, Post Falls
-
-
LaMeres, B.1
McIntosh, C.2
-
16
-
-
70349097557
-
Fab process for high speed coaxial to coplanar off-chip interconnect
-
presented at the, London, U.K, Sep. 1-4
-
C. McIntosh and B. LaMeres, "Fab process for high speed coaxial to coplanar off-chip interconnect," presented at the Electron. Syst.-Inte-gration Technol. Conf., London, U.K., Sep. 1-4, 2008.
-
(2008)
Electron. Syst.-Inte-gration Technol. Conf
-
-
McIntosh, C.1
LaMeres, B.2
-
21
-
-
0020121982
-
Gold bonding wire for semiconductor applications
-
Mar
-
S. Tomiyama and Y. Fukui, "Gold bonding wire for semiconductor applications," J. Gold Sci., Technol., Appl., vol. 15, no. 2, Mar. 1982.
-
(1982)
J. Gold Sci., Technol., Appl
, vol.15
, Issue.2
-
-
Tomiyama, S.1
Fukui, Y.2
|