-
1
-
-
0032231154
-
The ultraCSP wafer scale package
-
Dec. 8-10, Singapore
-
Elenius, P., 1998, "The UltraCSP Wafer Scale Package," IEEE/CPMT Electronics Packaging Technology Conference, Proceedings of 2nd, pp. 83-88, Dec. 8-10, Singapore.
-
(1998)
IEEE/CPMT Electronics Packaging Technology Conference, Proceedings of 2nd
, pp. 83-88
-
-
Elenius, P.1
-
2
-
-
0031644347
-
Creep behavior of a flip-chip package by both FEM modeling and real time moiré interferometry
-
Seattle, WA, USA, May 25-28
-
Wang, J., Qian, Z., Zou, D., and Liu, S., 1998, "Creep Behavior of a Flip-Chip Package by Both FEM Modeling and Real Time Moiré Interferometry," Proceeding of Electronic Components and Technology Conference, 48th, Seattle, WA, USA, pp. 1438-1445, May 25-28.
-
(1998)
Proceeding of Electronic Components and Technology Conference, 48th
, pp. 1438-1445
-
-
Wang, J.1
Qian, Z.2
Zou, D.3
Liu, S.4
-
3
-
-
0042645192
-
-
10569-5503/91/0000-0797 IEEE
-
Daveaux, R., and Benerji, K., 1991, "Fatigue Analysis of Flip Chip Assemblies Using Thermal Stress Simulations and a Coffin-Manson Relation," 10569-5503/91/0000-0797 IEEE, pp. 797-805.
-
(1991)
Fatigue Analysis of Flip Chip Assemblies Using Thermal Stress Simulations and a Coffin-Manson Relation
, pp. 797-805
-
-
Daveaux, R.1
Benerji, K.2
-
4
-
-
0030710838
-
Flex-on-cap solder paste bumping
-
Goodman, T., and Elenius, P., 1997, "Flex-On-Cap Solder Paste Bumping," Electronic Components and Technology Conference '97, pp. 248-253.
-
(1997)
Electronic Components and Technology Conference '97
, pp. 248-253
-
-
Goodman, T.1
Elenius, P.2
-
5
-
-
0039138352
-
-
Collins, J. A., 1984, "Failure of Materials in Mechanical Design - Analysis, Prediction, Prevention," pp. 384-387.
-
(1984)
Failure of Materials in Mechanical Design - Analysis, Prediction, Prevention
, pp. 384-387
-
-
Collins, J.A.1
-
7
-
-
85036410404
-
A study of the effects of cyclic thermal stresses on a ductile metal
-
Coffin, L. F., Jr., 1954, "A Study of the Effects of Cyclic Thermal Stresses on a Ductile Metal," Trans. ASME, 76, pp. 931-950.
-
(1954)
Trans. ASME
, vol.76
, pp. 931-950
-
-
Coffin L.F., Jr.1
-
8
-
-
0035388783
-
A study of factors affecting solder joint fatigue life of thermally enhanced ball grid array assemblies
-
Cheng, H. C., Chiang, K. N., Chen, C. K., and Lin, J. C., 2001, "A Study of Factors Affecting Solder joint Fatigue Life of Thermally Enhanced Ball Grid Array Assemblies," Journal of the Chinese Institute of Engineers, 24, No. 4, pp. 439-451.
-
(2001)
Journal of the Chinese Institute of Engineers
, vol.24
, Issue.4
, pp. 439-451
-
-
Cheng, H.C.1
Chiang, K.N.2
Chen, C.K.3
Lin, J.C.4
-
9
-
-
34250605357
-
Fatigue: A complex subject-some simple approximations
-
Manson, S. S., 1965, "Fatigue: A Complex Subject-Some Simple Approximations," Experimental Mechanics, 5, No. 7, pp. 193-226.
-
(1965)
Experimental Mechanics
, vol.5
, Issue.7
, pp. 193-226
-
-
Manson, S.S.1
-
10
-
-
0033907410
-
On enhancing eutectic solder joint using a 2nd-reflow-process approach
-
Feb.
-
Chiang, K. N., and Cheng, H. C., 2000, "On Enhancing Eutectic Solder Joint Using A 2nd-Reflow-Process Approach," IEEE Transaction on Advanced Packaging, 23(1), pp. 9-14, Feb..
-
(2000)
IEEE Transaction on Advanced Packaging
, vol.23
, Issue.1
, pp. 9-14
-
-
Chiang, K.N.1
Cheng, H.C.2
-
11
-
-
0026961523
-
Predicting thermal fatigue lifetimes for SMT solder joints
-
Sauber, J., and Seyyedi, J., 1992, "Predicting Thermal Fatigue Lifetimes for SMT Solder Joints," ASME Journal of Electronic Packaging, 114, pp. 472-476.
-
(1992)
ASME Journal of Electronic Packaging
, vol.114
, pp. 472-476
-
-
Sauber, J.1
Seyyedi, J.2
-
12
-
-
0030172955
-
Parametric finite element analysis of flip chip reliability
-
Second Quarter
-
Yeh, C. P., Zhou, Wen X., and Wyatt, K., 1996, "Parametric Finite Element Analysis of Flip Chip Reliability," The International journal of Microcircuits and Electronic Packaging, 19(2), pp. 120-127, Second Quarter.
-
(1996)
The International Journal of Microcircuits and Electronic Packaging
, vol.19
, Issue.2
, pp. 120-127
-
-
Yeh, C.P.1
Zhou, W.X.2
Wyatt, K.3
-
13
-
-
0032321032
-
On the life prediction and accelerated testing of solder joints
-
ASME, International Mechanical Engineering Congress and Exposition, Anaheim, CA, Nov. 15-20
-
Qian, Z., and Liu, S., 1998, "On the Life Prediction and Accelerated Testing of Solder Joints," EEP-Vol. 24, Thermo-Mechanical Characterization of Evolving Packaging Materials and Structures, ASME, International Mechanical Engineering Congress and Exposition, Anaheim, CA, pp. 1-11, Nov. 15-20.
-
(1998)
Thermo-mechanical Characterization of Evolving Packaging Materials and Structures
, vol.24 EEP
, pp. 1-11
-
-
Qian, Z.1
Liu, S.2
-
14
-
-
0032096802
-
An alternative local/ global finite element approach for ball grid array typed packages
-
Cheng, H. C., Chiang, K. N., and Lee, M. H., 1998, "An Alternative Local/ Global Finite Element Approach for Ball Grid Array Typed Packages," ASME Journal of Electronic Packaging, 120, pp. 129-134.
-
(1998)
ASME Journal of Electronic Packaging
, vol.120
, pp. 129-134
-
-
Cheng, H.C.1
Chiang, K.N.2
Lee, M.H.3
-
15
-
-
0030216690
-
Reliability of metallized ceramic packages
-
Subbarayan, G., Ferri, M. G., and DeFpster, S. M., 1996, "Reliability of Metallized Ceramic Packages," IEEE Transactions on Components, Packaging and Manufacturing Technology-Part B, 19, No. 3, pp. 685-691.
-
(1996)
IEEE Transactions on Components, Packaging and Manufacturing Technology-part B
, vol.19
, Issue.3
, pp. 685-691
-
-
Subbarayan, G.1
Ferri, M.G.2
DeFpster, S.M.3
|