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Volumn 124, Issue 3, 2002, Pages 234-239

Analysis of wire interconnect technology wafer level packaging

Author keywords

Chip Scale Package; Wafer Level Packaging; Wire Interconnect Technology

Indexed keywords


EID: 0041369612     PISSN: 10437398     EISSN: None     Source Type: Journal    
DOI: 10.1115/1.1481368     Document Type: Article
Times cited : (27)

References (15)
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  • 8
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    • A study of factors affecting solder joint fatigue life of thermally enhanced ball grid array assemblies
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  • 9
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    • Chiang, K. N., and Cheng, H. C., 2000, "On Enhancing Eutectic Solder Joint Using A 2nd-Reflow-Process Approach," IEEE Transaction on Advanced Packaging, 23(1), pp. 9-14, Feb..
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    • Chiang, K.N.1    Cheng, H.C.2
  • 11
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    • Predicting thermal fatigue lifetimes for SMT solder joints
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    • On the life prediction and accelerated testing of solder joints
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    • An alternative local/ global finite element approach for ball grid array typed packages
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.