On the choice of a regulator for the extraction of depth profiles from ARXPS data obtained on plasma-treated polystyrene

Journal of Electron Spectroscopy and Related Phenomena

Volumn 177, Issue 1, 2010, Pages 5-14

  Paynter, R W ^a  

^a INRS EMT   (Canada)

Author keywords

Angle resolved X ray photoelectron spectroscopy; Maximum entropy regularization; Tikhonov regularization

Indexed keywords

ANGLE RESOLVED X RAY PHOTOELECTRON SPECTROSCOPY; APRIORI; DEPTH PROFILE; MAXIMUM ENTROPY; OXYGEN CONCENTRATIONS; PLASMA-OXIDIZED POLYSTYRENES; REGULARIZATION PARAMETERS; TIKHONOV REGULARIZATION;

OXYGEN; PHOTOELECTRICITY; PHOTOIONIZATION; PHOTONS; POLYMER BLENDS; POLYSTYRENES;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 77949271469     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.elspec.2009.09.006     Document Type: Article

References (25)

1. Fadley C.S. Prog. Solid State Chem. 11 (1976) 265
2. Dwyer V.M. Surf. Interface Anal. 20 (1993) 687
3. Cumpson P.J. J. Electron Spectrosc. Relat. Phenom. 73 (1995) 25
4. Ro C.-U. Surf. Interface Anal. 25 (1997) 869
5. Tyler B.J., Castner D.G., and Ratner B.D. Surf. Interface Anal. 14 (1989) 443
6. Cumpson P.J. Appl. Surf. Sci. 144/145 (1999) 16
7. Benmassaoud A.A., and Paynter R.W. Thin Solid Films 287 (1996) 125
8. Tougaard S. Surf. Interface Anal. 25 (1997) 137
9. Scofield J.H. J. Electron Spectrosc. Relat. Phenom. 8 (1976) 129
10. Cumpson P.J., and Seah M.P. Surf. Interface Anal. 25 (1997) 430
11. Powell C.J., and Jablonski A. Surf. Interface Anal. 33 (2002) 211
12. Baschenko O.A., and Nesmeev A.E. J. Electron Spectrosc. Relat. Phenom. 57 (1991) 33
13. Suzuki N., Iimura K., Satoh S., Saito Y., Kato T., and Tanaka A. Surf. Interface Anal. 25 (1997) 650
14. Suzuki N., Kato T., and Tougaard S. Surf. Interface Anal. 31 (2001) 862
15. Powell C.J., and Jablonski A. NIST Electron Effective-Attenuation-Length Database, SRD 82. US Department of Commerce (2001), National Institute of Standards and Technology, Gaithersburg, MD
16. Paynter R.W. Surf. Interface Anal. 3 (1981) 186
17. Powell C.J., and Jablonski A. NIST Electron Inelastic-Mean-Free-Path Database, SRD 71, US Department of Commerce (2000), National Institute of Standards and Technology, Gaithersburg, MD
18. Gries W.H. Surf. Interface Anal. 24 (1996) 38
19. Chanbi Z., and Paynter R.W. J. Electron Spectrosc. Relat. Phenom. 164 (2008) 28
20. Paynter R.W., and Chanbi Z. Appl. Surf. Sci. 255 (2008) 2746
21. Smith G.C., and Livesey A.K. Surf. Interface Anal. 19 (1992) 175
22. Gull S.F., and Skilling J. IEE Proc. 131 (1984) 646
23. Ménard M., and Paynter R.W. Surf. Interface Anal. 37 (2005) 466
24. Landl G., and Anderssen R.S. Inverse Probl. 12 (1996) 35
25. Geoghegan M., Jones R.A.L., Sivia D.S., Penfold J., and Clough A.S. Phys. Rev. E 53 (1996) 825