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Volumn 287, Issue 1-2, 1996, Pages 125-129
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Influence of the power and pressure on the growth rate and refractive index of a-C:H thin films deposited by r.f. Plasma-enhanced chemical vapour deposition
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Author keywords
Amorphous materials; Carbon; Optical properties; Plasma processing and deposition
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Indexed keywords
CARBON;
CHEMICAL VAPOR DEPOSITION;
ELLIPSOMETRY;
FILM GROWTH;
OPTICAL PROPERTIES;
PLASMA APPLICATIONS;
PRESSURE EFFECTS;
SURFACE STRUCTURE;
THERMAL CONDUCTIVITY OF SOLIDS;
THERMODYNAMIC STABILITY;
THIN FILMS;
HYDROGENATED AMORPHOUS CARBON;
PLASMA ENHANCED CHEMICAL VAPOUR DEPOSITION;
AMORPHOUS FILMS;
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EID: 0030259425
PISSN: 00406090
EISSN: None
Source Type: Journal
DOI: 10.1016/S0040-6090(96)08777-9 Document Type: Article |
Times cited : (30)
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References (19)
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