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Volumn 31, Issue 9, 2001, Pages 862-868

Level of consistency in quantification and IMFP determination by the Tougaard method applied to XPS of a Langmuir-Blodgett film taken at widely different emission angles

(3) Suzuki, Noboru a Kato, Teiji a Tougaard, Sven b

a UTSUNOMIYA UNIVERSITY (Japan)

b UNIVERSITY OF SOUTHERN DENMARK (Denmark)

Author keywords

Inelastic mean free path; Langmuir Blodgett (LB) film; Quantitative surface analysis; Tougaard method; XPS

Indexed keywords

CADMIUM COMPOUNDS; ELECTRON ENERGY LEVELS; KINETIC ENERGY; PHOTOEMISSION; PHOTOLYSIS; PHOTOPOLYMERIZATION; STATISTICAL METHODS; X RAY PHOTOELECTRON SPECTROSCOPY;

INELASTIC MEAN FREE PATH (IMFP);

LANGMUIR BLODGETT FILMS;

EID: 0035445389 PISSN: 01422421 EISSN: None Source Type: Journal
DOI: 10.1002/sia.1116 Document Type: Article

Times cited : (17)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.