Simulation study on regeneration of depth profiles from angle-resolved XPS data

Surface and Interface Analysis

Volumn 25, Issue 11, 1997, Pages 869-877

  Ro, Chul Un ^a  

^a Hallym University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

INSTRUMENT ERRORS; LAPLACE TRANSFORMS; X RAY PHOTOELECTRON SPECTROSCOPY;

DEPTH PROFILES REGENERATION;

INTERFACES (MATERIALS);

EID: 0031245014     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1096-9918(199710)25:11<869::AID-SIA310>3.0.CO;2-D     Document Type: Article

References (26)